Apparatus and method for enabled switch detection

ABSTRACT

Apparatuses and methods for enabled switch detection are disclosed. In one embodiment, an apparatus includes a complimentary metal oxide semiconductor (CMOS) switch having a gate, a drain, a source, and a well. The source and drain are formed in the well, and the gate is formed adjacent the well between the source and drain. The source is configured to receive a radio frequency signal from a first power amplifier. The apparatus further includes a switch enable detect block configured to compare a signal indicative of the gate voltage of the first switch to a first reference signal and to generate an output comparison signal based at least partly on the comparison. The apparatus further includes a power amplifier bias control block configured to enable the first power amplifier based at least partly on the output comparison signal from the switch sense block.

PRIORITY CLAIM

This application claims the benefit of priority under 35 U.S.C. §119(e)of U.S. Provisional Patent Application No. 61/352,330, entitled“Circuits & Systems,” filed Jun. 7, 2010, which is hereby incorporatedherein by reference in its entirety to be considered part of thisspecification.

BACKGROUND

1. Field

Embodiments of the invention relate to electronic systems, and inparticular, to radio frequency (RF) electronics.

2. Description of the Related Technology

RF power amplifiers can be used to boost the power of a RF signal havinga relatively low power. Thereafter, the boosted RF signal can be usedfor a variety of purposes, included driving the antenna of atransmitter.

Power amplifiers can be included in mobile phones to amplify a RF signalfor transmission. For example, in mobile phones having a time divisionmultiple access (TDMA) architecture, such as those found in GlobalSystem for Mobile Communications (GSM), code division multiple access(CDMA), and wideband code division multiple access (W-CDMA) systems, apower amplifier can be used to shift power envelopes up and down withinprescribed limits of power versus time. It can be important manage theamplification of a RF signal, as a particular mobile phone can beassigned a transmission time slot for a particular frequency channel.Power amplifiers can be employed to aid in regulating the power level ofthe RF signal over time, so as to prevent signal interference fromtransmission during an assigned receive time slot and to reduce powerconsumption.

There is a need for improved power amplifiers. Furthermore, there is aneed for power amplifier systems have reduced power consumption, lowermanufacturing cost and enhanced performance.

SUMMARY

In certain embodiments, the present disclosure relates to an apparatusfor controlling one or more power amplifiers. The apparatus includes afirst complimentary metal oxide semiconductor (CMOS) switch having agate, a drain, a source, and a well, the source and drain formed in thewell, the gate formed adjacent the well between the source and drain,and the source configured to receive a radio frequency signal from afirst power amplifier. The apparatus further includes a switch enabledetect block configured to compare a signal indicative of the gatevoltage of the first switch to a first reference signal and to generatean output comparison signal based at least partly on the result. Theapparatus further includes a power amplifier bias control blockconfigured to enable the first power amplifier based at least partly onthe output comparison signal from the switch enable detect block.

In various embodiments, the well has a p-type doping and the firstswitch includes an n-well for electrically isolating the well from asubstrate.

In some embodiments, the apparatus further includes a gate bias controlblock for biasing the gate voltage of the first switch, the gate biascontrol block configured to bias the gate voltage of the first switch toat least two voltage levels.

In a number of embodiments, the switch enable detect block is configuredto compare an enable signal of the gate bias control block to thereference signal.

In accordance with several embodiments, the gate bias control blockincludes at least one charge pump.

According to some embodiments, the switch enable detect block isconfigured to compare the gate voltage of the first switch to thereference signal.

In certain embodiments, the reference signal is a voltage of the well ofthe first CMOS switch.

In various embodiments, the apparatus further includes a second CMOSswitch having a gate, a drain, a source, and a well, the source anddrain formed in the well, the gate formed adjacent the well between thesource and drain, and the source configured to receive a radio frequencysignal from a second power amplifier.

In several embodiments, the switch enable detect block is furtherconfigured to compare a signal indicative of the gate voltage of thesecond switch to a second reference signal and to generate the outputcomparison signal based at least partly on the comparison, and whereinthe power amplifier bias control block is configured to enable thesecond power amplifier based at least partly on the output comparisonsignal from the switch enable detect block.

In certain embodiments, the apparatus further includes a well biascontrol block for biasing the well voltage of the first and secondswitches to a well bias voltage, the well bias control block configuredto bias the well bias voltage to at least two voltage levels.

In accordance with a number of embodiments, the first and secondreference signals are equal to about the well bias voltage.

In various embodiments, the switch enable detect block is a NOR gateconfigured to receive the gate voltage of the first switch as a firstinput and the gate voltage of the second switch as a second input, thenegative supply of the NOR gate equal to about the well bias voltage.

In some embodiments, the apparatus further includes a level shifterconfigured to receive the output comparison signal from the switchenable detect block and provide a level shifted output comparison signalto the power amplifier bias control block.

In a number of embodiments, the first switch and the first poweramplifier are disposed on separate dies.

In certain embodiments, the present disclosure relates to a method ofcontrolling one or more power amplifiers. The method includes setting afirst power amplifier in a disabled state. The method further includesmeasuring a signal indicative of a gate voltage of a CMOS switch havinga source configured to receive a radio frequency signal from the firstpower amplifier. The method further includes comparing the measuredsignal to a reference signal. The method further includes setting thefirst power amplifier in an enabled state based at least partly on thecomparison.

In various embodiments, comparing the measured signal to a referencesignal includes determining if the gate voltage of the switch is greaterthan a well voltage of the switch by at least about a threshold voltageof the first switch.

According to several embodiments, comparing the measured signal to areference signal includes determining if the gate voltage of the switchis greater than the well voltage of the switch by at least about n timesthe threshold voltage of the switch, n being an integer greater than orequal to one.

In some embodiments, the method further includes further biasing thegate voltage of the switch.

In accordance with certain embodiments, biasing the gate voltage of theswitch includes biasing the gate voltage of the switch using a chargepump.

In a number of embodiments, comparing the measured signal to a referencesignal includes comparing an enable signal of the charge pump to thereference signal.

In several embodiments, the method further includes providing aquiescent current of the power amplifier to the source of the switchafter enabling the power amplifier.

In various embodiments, the method further includes providing a radiofrequency signal from the first power amplifier to an antenna of awireless device through the switch.

In certain embodiments, the present disclosure relates to acomputer-readable storage medium including instructions that whenexecuted by a processor perform a method of controlling a poweramplifier configured to provide a radio frequency signal to a CMOSswitch. The method includes setting the power amplifier in a disabledstate. The method further includes receiving a comparison signal, thecomparison signal based at least partly upon a comparison of a referencesignal to a signal indicative of a gate voltage of the CMOS switch. Themethod further includes setting the power amplifier in an enabled statebased at least partly on the comparison signal.

In some embodiments, the present disclosure relates to an apparatus forcontrolling one or more power amplifiers. The apparatus includes meansfor setting a first power amplifier in a disabled state. The apparatusfurther includes means for measuring a signal indicative of a gatevoltage of a CMOS switch, the CMOS switch configured to receive a radiofrequency signal from the power amplifier. The apparatus furtherincludes means for comparing the measured signal to a reference signaland for generating a comparison signal based at least partly on theresult. The apparatus further includes means for setting the poweramplifier in an enabled state based at least partly on the comparisonsignal.

In certain embodiments, the present disclosure relates to an apparatusfor sensing a bias voltage of a switch. The apparatus includes acomplimentary metal oxide semiconductor (CMOS) switch having a gate, adrain, a source, and a well, the source and drain formed in the well,the gate formed adjacent the well between the source and drain, and thesource configured to receive a bias voltage from a power amplifier. Theapparatus further includes a switch sense block configured to measure asignal indicative of the voltage of at least one of the source or drainvoltage of the switch and to generate an output signal based on themeasurement.

In a number of embodiments, the well has a p-type doping and the switchincludes an n-well for electrically isolating the well from a substrate.

According to various embodiments, the switch sense block is configuredto measure a signal indicative of the source voltage of the switch.

In several embodiments, the switch sense block is configured to measurea signal indicative of the drain voltage of the switch.

In accordance with some embodiments, the switch sense block includes afilter for filtering the measured signal to produce a filtered signaland a voltage detector for generating the output signal based at leastpartly upon the voltage level of the filtered signal.

In certain embodiments, the filter is a low pass filter.

In various embodiments, the filter is a RC filter.

In several embodiments, the voltage detector is an inverter.

In a number of embodiments, the apparatus further includes a well biascontrol block for biasing the well voltage of the first switch, the wellbias control block configured to bias the well voltage to at least twovoltage levels.

In certain embodiments, the well bias control block is configured toselect the voltage level for biasing the well based at least partly onthe output signal of the switch sense block.

In some embodiments, the well bias control block includes at least onecharge pump.

According to various embodiments, the apparatus further includes aresistor having a first end electrically connected to the source of theswitch and a second end electrically connected to the drain of theswitch.

In some embodiments, the first switch and the first power amplifier aredisposed on separate dies.

In certain embodiments, the present disclosure relates to a method forsensing a bias voltage of a CMOS switch configured to receive a radiofrequency signal from a power amplifier. The method includes measuring asignal indicative of at least one of a source voltage or a drain voltageof the switch. The method further includes generating an output signalbased on the measurement.

In accordance with various embodiments, measuring the signal includesmeasuring the source voltage of the switch.

In a number of embodiments, measuring the signal includes measuring thedrain voltage of the switch.

In some embodiments, the method further includes biasing a well of theswitch to a voltage level corresponding to a disabled state of the well.

According to certain embodiments, the method further includes biasingthe well of the switch to a voltage level corresponding to an enabledstate of the well based at least partly on the output signal.

In a number of embodiments, biasing the well to an enabled stateincludes biasing the well voltage level using a charge pump.

In some embodiments, the method further includes providing the chargepump a first power supply and providing the power amplifier a secondpower supply, wherein the first power supply and second power supply aredifferent power supplies.

In various embodiments, the method further includes filtering themeasured signal to generate a filtered signal.

According to a number of embodiments, generating the output signalincludes comparing the filtered signal to a reference signal.

In several embodiments, generating the output signal includes comparingthe filtered signal to a trip point of an inverter.

In certain embodiments, the present disclosure relates to acomputer-readable storage medium including instructions that whenexecuted by a processor perform a method for sensing a bias voltage of aCMOS switch configured to receive a radio frequency signal from a poweramplifier. The method includes receiving a signal indicative of thevoltage of at least one of the source or drain voltage of the switch.The method further includes generating an output signal based on thereceived signal.

In some embodiments, the present disclosure relates to an apparatus forsensing a bias voltage of a CMOS switch configured to receive a radiofrequency signal from a power amplifier. The apparatus includes meansfor measuring a signal indicative of the voltage of at least one of thesource or drain voltage of the switch. The apparatus further includesmeans for generating an output signal based on the measurement.

In certain embodiments, the present disclosure relates to an apparatusfor biasing one or more switches. The apparatus includes a firstcomplimentary metal oxide semiconductor (CMOS) switch having a gate, adrain, a source, and a well, the source and drain formed in the well,the gate formed adjacent the well between the source and drain, and thesource configured to receive a bias voltage from a power amplifier. Theapparatus further includes a gate bias control block for biasing thegate voltage of the first switch, the gate bias control block configuredto bias the gate voltage of the first switch to at least two voltagelevels. The apparatus further includes a well bias control block forbiasing the well voltage of the first switch, the well bias controlblock configured to bias the well voltage of the first switch to atleast two voltage levels. The apparatus further includes a buffercircuit for increasing the impedance between the well bias control blockand the well of the first switch.

According to various embodiments, the well has a p-type doping and thefirst switch includes an n-well for electrically isolating the well froma substrate.

In some embodiments, the buffer circuit includes a resistor having afirst end electrically connected to an output of the well bias controlblock and a second end electrically connected to the well of the firstswitch.

In a number of embodiments, the resistor has a resistance rangingbetween about 10 k Ω and to about 200 kΩ.

In accordance with several embodiments, the buffer circuit includes anoperational amplifier having a positive input, a negative input, and anoutput configured to control the voltage level of the well of theswitch, wherein the well bias control block is configured to control thepositive input and the negative input of the operational amplifier basedat least partly upon the voltage level of the well of the switch.

In some embodiments, the buffer circuit includes a transconductanceamplifier having a positive input, a negative input, and an outputconfigured to deliver a current to the well of the switch, wherein thewell bias control block is configured to control the positive input andthe negative input of the operational amplifier based at least partlyupon the voltage level of the well of the switch.

In certain embodiments, the switch includes an ON state and an OFFstate, wherein the well bias control block is configured to bias thewell of the switch at about a first voltage level in the OFF state, andwherein the gate bias control block is configured to bias the well ofthe switch at about the first voltage level in the OFF state.

In a number of embodiments, the switch includes an ON state and an OFFstate, wherein the well bias control block is configured to bias thewell of the switch at about a first voltage level in the OFF state, andwherein the gate bias control block is configured to bias the well ofthe switch at about the first voltage level in the OFF state.

According to various embodiments, the well bias control block isconfigured to bias the well of the switch at about a second voltagelevel in the ON state, wherein the gate bias control block is configuredto bias the well of the switch at about a third voltage level in the ONstate, the third voltage level greater than the second voltage level.

In some embodiments, the apparatus further includes a second CMOSswitch, wherein the gate bias control block is further configured tobias the gate of the second switch to at least two voltage levels, andwherein the well bias control block is further configured to bias thewell of the second switch to at least two voltage levels.

In a number of embodiments, the gate bias control block can bias thegate voltage of the first and second switches to different voltagelevels, wherein the well bias control block can bias the well voltage ofthe first and second switches to different voltage levels.

In certain embodiments, the present disclosure relates to a method ofbiasing one or more CMOS switches. The method includes biasing a gate ofa first CMOS switch configured to receive a radio frequency signal froma power amplifier, biasing the gate including increasing the voltagelevel of the gate from a first gate voltage level to a second gatevoltage level. The method further includes biasing a well of the firstCMOS switch, biasing the well including increasing the voltage level ofthe well from a first well voltage level to a second well voltage level.The method further includes buffering the well of the first switch so asto increase the time it takes to increase the voltage level of the wellfrom the first well voltage level to the second well voltage level.

In accordance with some embodiments, buffering the well includesproviding a resistor to increase the impedance between the well and aregulator for biasing the well.

In various embodiments, buffering the well includes providing anoperational amplifier to increase the impedance between the well and aregulator for biasing the well.

In several embodiments, buffering the well includes providing atransconductance amplifier to increase the impedance between the welland a regulator for biasing the well.

In a number of embodiments, the first gate voltage level and the firstwell voltage level are about equal.

According to certain embodiments, the second gate voltage level isgreater than the second well voltage level.

In a number of embodiments, biasing the well includes using a chargepump.

In various embodiments, biasing the gate includes using a charge pump.

In accordance with several embodiments, biasing and buffering areperformed in an electronic circuit disposed on a single CMOS die.

In some embodiments, the present disclosure relates to an apparatus forbiasing one or more CMOS switches. The apparatus includes a means forbiasing a gate of a first CMOS switch configured to receive a radiofrequency signal from a power amplifier, the means for biasing the gateconfigured to bias the gate of the first switch to at least two voltagelevels. The apparatus further includes a means for biasing a well of thefirst CMOS switch, the means for biasing the well configured to bias thewell of the first switch to at least two voltage levels. The apparatusfurther includes a means for increasing the impedance between the wellof the first switch and the means for biasing the well.

In certain embodiments, the present disclosure relates to an apparatusfor disabling a bias voltage for biasing one or more switches. Theapparatus includes a first complimentary metal oxide semiconductor(CMOS) switch having a gate, a drain, a source, and a well, the sourceand drain formed in the well, the gate formed adjacent the well betweenthe source and drain, and the source configured to receive a biasvoltage from a power amplifier. The apparatus further includes a wellbias control block for biasing the well voltage of the first switch, thewell bias control block configured to bias the well voltage of the firstswitch to at least two voltage levels. The apparatus further includes adisable circuit for disabling the well bias control block so as toprevent the well bias control block from biasing the well.

In several embodiments, the well has a p-type doping and the firstswitch includes an n-well for electrically isolating the well from asubstrate

In a number of embodiments, the buffer circuit includes a PMOStransistor having a gate, a drain and a source, the drain of the PMOStransistor electrically connected to the well of the first switch, thesource of the PMOS transistor electrically connected to an output of thewell bias control block, and the gate of the PMOS transistorelectrically connected to a disable control signal.

In accordance with various embodiments, the apparatus further includesan NMOS transistor having a gate, a drain and a source, the drain of theNMOS transistor electrically connected to the well of the first switch,the gate of the NMOS transistor electrically connected to the disablecontrol signal, and the source of the NMOS transistor electricallyconnected to a voltage reference.

In some embodiments, the voltage reference is a ground supply of awireless device.

In certain embodiments, the apparatus further includes a buffer circuitfor increasing the impedance between the well bias control block and thewell of the first switch.

According to a number of embodiments, the buffer circuit is electricallyconnected between the disable circuit and the well of the first switch.

In various embodiments, the buffer circuit includes a resistor having afirst end electrically connected to an output of the disable circuit anda second end electrically connected to the well of the first switch.

In several embodiments, the resistor has a resistance ranging betweenabout 10 kΩ to about 200 kΩ.

In certain embodiments, the buffer circuit includes a PMOS transistorhaving a gate, a drain and a source and an NMOS transistor having agate, a drain and a source, the source of the PMOS transistorelectrically connected to an output of the well bias control block, thedrain of the PMOS transistor electrically connected to the first end ofthe resistor and to the drain of the NMOS transistor, the gates of theNMOS and PMOS transistors electrically connected to a disable controlsignal, and the source of the NMOS transistor electrically connected toa voltage reference.

In some embodiments, the buffer circuit is electrically connectedbetween the well bias control block and the disable circuit.

According to a number of embodiments, the buffer circuit includes anoperational amplifier having a positive input, a negative input, and anoutput configured to provide a voltage level for biasing the well to thedisable circuit, the well bias control block configured to control thepositive input and the negative input of the operational amplifier basedat least partly upon the voltage level of the well of the switch.

In certain embodiments, the present disclosure relates to a method ofdisabling a bias voltage for biasing one or more CMOS switches. Themethod includes disabling a well bias control circuit for biasing a wellof a first CMOS switch using a disable circuit. The method furtherincludes enabling a power amplifier for providing a radio frequencysignal to a source of the first switch. The method further includesenabling the well bias control circuit using the disable circuit. Themethod further includes biasing the well of the first switch using thewell bias control circuit.

In some embodiments, biasing the well of the first switch includesbiasing the well voltage of the switch using a regulator.

In a number of embodiments, biasing the well of the first switchincludes biasing the well voltage of the switch using a charge pump.

In accordance with various embodiments, disabling the well bias controlcircuit includes increasing the impedance between the regulator and thewell of the switch using a first transistor.

In some embodiments, disabling the well bias control circuit furtherincludes biasing the well of the first switch to a voltage referenceusing a second transistor.

In a number of embodiments, the voltage reference is a ground supply ofa wireless device.

In various embodiments, the method further includes buffering the wellof the first switch so as to increase the impedance between the well ofthe first switch and the output of the regulator.

According to several embodiments, buffering the well includes using aresistor to increase the impedance between the well and the regulator.

In some embodiments, buffering the well includes using an operationalamplifier to increase the impedance between the well and the regulator.

In a number of embodiments, the present disclosure relates to acomputer-readable storage medium including instructions that whenexecuted by a processor perform a method of disabling a bias voltage forbiasing one or more CMOS switches. The method includes disabling a wellbias control circuit for biasing a well of a first CMOS switch. Themethod further includes enabling a power amplifier for providing a radiofrequency signal to a source of the first switch. The method furtherincludes enabling the well bias control circuit.

In some embodiments, the present disclosure relates to an apparatus fordisabling a bias voltage for biasing one or more switches. The apparatusincludes means for biasing a well of a first switch. The apparatusfurther includes means for disabling the means for biasing. Theapparatus further includes means for enabling a power amplifierconfigured to provide a radio frequency signal to a source of the firstswitch. The apparatus further includes means for enabling the means forbiasing.

For purposes of summarizing the disclosure, certain aspects, advantagesand novel features of the inventions have been described herein. It isto be understood that not necessarily all such advantages may beachieved in accordance with any particular embodiment of the invention.Thus, the invention may be embodied or carried out in a manner thatachieves or optimizes one advantage or group of advantages as taughtherein without necessarily achieving other advantages as may be taughtor suggested herein.

The present disclosure relates to U.S. patent application Ser. No.12/844,449, titled “APPARATUS AND METHOD FOR WELL BUFFERING,” U.S.patent application Ser. No. 12/844,301, titled “VOLTAGE APPARATUS ANDMETHOD FOR DIFFUSION SENSING,” and U.S. patent application Ser. No.12/844,491, titled “APPARATUS AND METHOD FOR DISABLING WELL BIAS,” eachfiled on even date herewith and each hereby incorporated by referenceherein in its entirety.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 schematically depicts a power amplifier module for amplifying aradio frequency (RF) signal.

FIG. 2 schematically depicts an example wireless device that can haveone or more of the power amplifier modules of FIG. 1 configured toprovide one or more functionalities as described herein.

FIGS. 3A and 3B show example system architectures that can beimplemented in the wireless device of FIG. 2.

FIGS. 4A and 4B schematically depict an example of how an RF signal to apower amplifier can be switched ON or OFF.

FIG. 5 shows that in certain embodiments, the switch depicted in FIGS.4A and 4B can be formed as a triple-well CMOS device.

FIG. 6 shows an example configuration for operating the triple-well CMOSswitch of FIG. 5.

FIG. 7 is a schematic diagram of part of a power amplifier system inaccordance with one embodiment.

FIG. 8A is a schematic block diagram of a p-well bias control block inaccordance with one embodiment.

FIG. 8B is a schematic block diagram of a gate bias control block inaccordance with one embodiment.

FIG. 8C is a schematic block diagram of a n-well bias control block inaccordance with one embodiment.

FIG. 9 is a schematic diagram of a power amplifier system in accordancewith another embodiment.

FIG. 10A is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 10B is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 11 is a method for biasing a power amplifier system in accordancewith one embodiment.

FIG. 12 is a schematic diagram of part of a power amplifier system inaccordance with another embodiment.

FIG. 13A is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 13B is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 13C is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 13D is a schematic block diagram of a power amplifier system inaccordance with another embodiment.

FIG. 13E is a schematic block diagram of a power amplifier system inaccordance with another embodiment, and which includes a bias controlsystem and a switch.

FIG. 14A is a schematic block diagram of a switch sense block inaccordance with one embodiment.

FIG. 14B is a schematic block diagram of a switch sense block inaccordance with another embodiment.

FIG. 15 is a method for biasing a power amplifier system in accordancewith another embodiment.

FIG. 16 is a schematic diagram of a power amplifier system in accordancewith another embodiment.

FIG. 17A is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with one embodiment.

FIG. 17B is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with another embodiment.

FIG. 17C is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with yet another embodiment.

FIG. 17D is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with still yet another embodiment.

FIG. 18 is a power amplifier system in accordance with anotherembodiment.

FIG. 19A is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with one embodiment.

FIG. 19B is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with another embodiment.

FIG. 19C is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with yet another embodiment.

FIG. 19D is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with still yet anotherembodiment.

FIG. 20 is a method for biasing a power amplifier system in accordancewith another embodiment.

DETAILED DESCRIPTION OF EMBODIMENTS

The headings provided herein, if any, are for convenience only and donot necessarily affect the scope or meaning of the claimed invention.

Provided herein are various non-limiting examples of devices and methodsfor facilitating amplification of a radio frequency (RF) signal. FIG. 1schematically depicts a power amplifier module (PAM) 10 that can beconfigured to achieve such an amplification of the RF signal so as toyield an output RF signal. As described herein, the power amplifiermodule can include one or more power amplifiers (PA).

FIG. 2 schematically depicts a device 11, such as a wireless device, forwhich one or more power amplifiers controlled by one or more features ofthe present disclosure can be implemented. The example wireless device11 depicted in FIG. 2 can represent a multi-band and/or multi-modedevice such as a multi-band/multi-mode mobile phone.

By way of examples, Global System for Mobile (GSM) communicationstandard is a mode of digital cellular communication that is utilized inmany parts of the world. GSM mode mobile phones can operate at one ormore of four frequency bands: 850 MHz (approximately 824-849 MHz for Tx,869-894 MHz for Rx), 900 MHz (approximately 880-915 MHz for Tx, 925-960MHz for Rx), 1800 MHz (approximately 1710-1785 MHz for Tx, 1805-1880 MHzfor Rx), 1900 MHz (approximately 1850-1910 MHz for Tx, 1930-1990 MHz forRx). Variations and/or regional/national implementations of the GSMbands are also utilized in different parts of the world.

Code division multiple access (CDMA) is another standard that can beimplemented in mobile phone devices. In certain implementations, CDMAdevices can operate in one or more of 900 MHz and 1900 MHz bands.

One or more features of the present disclosure can be implemented in theforegoing example modes and/or bands, and in other communicationstandards. For example, 3G and 4G are non-limiting examples of suchstandards.

In certain embodiments, the wireless device 11 can include a transceivercomponent 13 configured to generate RF signals for transmission via anantenna 14, and receive incoming RF signals from the antenna 14. It willbe understood that various functionalities associated with thetransmission and receiving of RF signals can be achieved by one or morecomponents that are collectively represented in FIG. 2 as thetransceiver 13. For example, a single component can be configured toprovide both transmitting and receiving functionalities. In anotherexample, transmitting and receiving functionalities can be provided byseparate components.

Similarly, it will be understood that various antenna functionalitiesassociated with the transmission and receiving of RF signals can beachieved by one or more components that are collectively represented inFIG. 2 as the antenna 14. For example, a single antenna can beconfigured to provide both transmitting and receiving functionalities.In another example, transmitting and receiving functionalities can beprovided by separate antennas. In yet another example, different bandsassociated with the wireless device 11 can be provided with one or moreantennas.

In FIG. 2, one or more output signals from the transceiver 13 aredepicted as being provided to the antenna 14 via one or moretransmission paths 15. In the example shown, different transmissionpaths 15 can represent output paths associated with different bandsand/or different power outputs. For example, two example poweramplifiers 17 shown can represent amplifications associated withdifferent power output configurations (e.g., low power output and highpower output), and/or amplifications associated with different bands.

In FIG. 2, one or more detected signals from the antenna 14 are depictedas being provided to the transceiver 13 via one or more receiving paths16. In the example shown, different receiving paths 16 can representpaths associated with different bands. For example, the four examplepaths 16 shown can represent quad-band capability that some wirelessdevices are provided with.

FIG. 2 shows that in certain embodiments, a switching component 12 canbe provided, and such a component can be configured to provide a numberof switching functionalities associated with an operation of thewireless device 11. In certain embodiments, the switching component 12can include a number of switches configured to provide functionalitiesassociated with, for example, switching between different bands,switching between different power modes, switching between transmissionand receiving modes, or some combination thereof. Various non-limitingexamples of such switches are described herein in greater detail.

FIG. 2 shows that in certain embodiments, a control component 18 can beprovided, and such a component can be configured to provide variouscontrol functionalities associated with operations of the switchingcomponent 12, the power amplifiers 17, and/or other operatingcomponent(s). Non-limiting examples of the control component 18 aredescribed herein in greater detail.

FIG. 2 shows that in certain embodiments, a processor 20 can beconfigured to facilitate implementation of various processes describedherein. For the purpose of description, embodiments of the presentdisclosure may also be described with reference to flowchartillustrations and/or block diagrams of methods, apparatus (systems) andcomputer program products. It will be understood that each block of theflowchart illustrations and/or block diagrams, and combinations ofblocks in the flowchart illustrations and/or block diagrams, may beimplemented by computer program instructions. These computer programinstructions may be provided to a processor of a general purposecomputer, special purpose computer, or other programmable dataprocessing apparatus to produce a machine, such that the instructions,which execute via the processor of the computer or other programmabledata processing apparatus, create means for implementing the actsspecified in the flowchart and/or block diagram block or blocks.

In certain embodiments, these computer program instructions may also bestored in a computer-readable memory (19 in FIG. 2) that can direct acomputer or other programmable data processing apparatus to operate in aparticular manner, such that the instructions stored in thecomputer-readable memory produce an article of manufacture includinginstruction means which implement the acts specified in the flowchartand/or block diagram block or blocks. The computer program instructionsmay also be loaded onto a computer or other programmable data processingapparatus to cause a series of operations to be performed on thecomputer or other programmable apparatus to produce a computerimplemented process such that the instructions that execute on thecomputer or other programmable apparatus provide steps for implementingthe acts specified in the flowchart and/or block diagram block orblocks.

FIGS. 3A and 3B show non-limiting examples of system architectures thatcan include one or more features of the present disclosure. For thepurpose of description, the example architectures are depicted with twoRF bands; however, it will be understood that other numbers of RF bandsare also possible. For example, system architectures having similarfunctionalities can be implemented in configurations having more thantwo bands (e.g., quad-band) or a single-band configuration.

In one example architecture 22, a first RF input indicated as “LB IN”and corresponding to a first band (e.g., a low band) can be amplified byone or more power amplifiers disposed and/or formed on a die 24 a. Suchamplified output RF signal is indicated as “LB OUT,” and can besubjected to impedance matching (e.g., to approximately 50Ω) by acomponent depicted as 30 a. Similarly, a second RF input indicated as“HB IN” and corresponding to a second band (e.g., a high band) can beamplified by one or more power amplifiers disposed and/or formed on adie 24 b. Such amplified output RF signal is indicated as “HB OUT,” andcan be subjected to impedance matching by a component depicted as 30 b(e.g., to approximately 50Ω).

In certain embodiments, amplification for a given RF band can includetwo or more amplification modes. For the example low RF band, the RFinput LB IN can be routed to a high power amplification mode or alow/medium power amplification mode via a switch depicted as 32 a. Ifthe switch 32 a is set for the high power mode, the RF signal canundergo amplification by one or more power amplifiers (e.g., by stagedamplifiers 29 a and 29 b) so as to yield a high power output. If theswitch 32 a is set for the low/medium power mode, the RF signal canundergo amplification by one or more power amplifiers.

In certain embodiments, the switch 32 a need not be employed. Forexample, the input impedance of the staged amplifiers 29 a and 30 a canbe substantially matched, and the RF input LB IN can be provided to bothstaged amplifiers 29 a and 30 a.

In the example shown, a low power mode can be achieved by utilizing apower amplifier 30 a; and a medium power mode can be achieved byamplifying the RF signal in stages by the power amplifier 30 a and asecond power amplifier 30 b. Examples of switching and routing of the RFsignals to allow selection of the low, medium and high power operatingmodes are described herein in greater detail. The low/medium amplifiedoutput RF signal can be subjected to impedance matching by a componentdepicted as 31 a prior to being output in a manner similar to that ofthe high power output signal.

Similarly, for the example high RF band, the RF input HB IN can berouted to a high power amplification mode or a low/medium poweramplification mode via a switch depicted as 32 b. If the switch 32 b isset for the high power mode, the RF signal can undergo amplification byone or more power amplifiers (e.g., by staged amplifiers 29 c and 29 d)so as to yield a high power output.

If the switch 32 b is set for the low/medium power mode, the RF signalcan undergo amplification by one or more power amplifiers. In theexample shown, a low power mode can be achieved by utilizing a poweramplifier 30 c; and a medium power mode can be achieved by amplifyingthe RF signal in stages by the power amplifier 30 c and a second poweramplifier 30 d. Examples of switching and routing of the RF signals toallow selection of the low, medium and high power operating modes aredescribed herein in greater detail. The low/medium amplified output RFsignal can be subjected to impedance matching by a component depicted as31 b prior to being output in a manner similar to that of the high poweroutput signal.

In the example architecture 22 depicted in FIG. 3A, operation of the lowand medium power modes can be facilitated by switch assemblies 27 a, 28a (for the low band) and 27 b, 28 b (for the high band). To operate in alow or medium power mode, for the low band, the switch 28 a can beclosed, and the switch 32 a can be in a state that routes the LB INsignal to the power amplifier 30 a. To operate in a medium power mode, aconnecting switch (depicted as the upper one in the switch assembly 27a) can be closed and a bypass switch (depicted as the lower one) can beopened, such that the power amplifiers 30 a and 30 b amplify the LB INsignal in stages to yield the medium power output. To operate in a lowoutput mode, the connecting switch of the switch assembly 27 a can beopened and the bypass switch of the switch assembly 27 a can be closed,such that the LB IN signal is amplified by the power amplifier 30 a bybypasses the power amplifier 30 b so as to yield the low power output.Operation of low or medium power mode for the high band can be achievedin a similar manner utilizing the switch assemblies 27 b and 28 b.

In the example configuration 22 shown in FIG. 3A, various switches(e.g., 27 a, 27 b, 28 a, 28 b) are depicted as being part of a die 23.In certain embodiments, the die 23 can also include a power amplifierbias control component 25. The PA bias control component 25 is depictedas controlling the example PAs (29 a, 29 b, 30 a, 30 b of the low bandportion, and 29 c, 29 d, 30 c, 30 d of the high band portion) via biascontrol lines depicted as 33 a and 33 b. In certain embodiments, the PAbias control component 25 can be provided with one or more input controlsignals 26 so as to facilitate one or more functionalities associatedwith various PAs as described herein.

In certain embodiments, various switches and power amplifiers associatedwith the dies depicted as 24 a, 24 b can be fabricated on substratessuch as gallium arsenide (GaAs) utilizing devices such as pseudomorphichigh electron mobility transistors (pHEMT) or bipolar field effecttransistors (BiFET). In certain embodiments, the dies depicted as 24 a,24 b in FIG. 3A can be formed on the same GaAs substrate, or on separateGaAs substrates. Further, functionalities associated with the diesdepicted as 24 a, 24 b can be formed on a single die, or on separatedies.

In certain embodiments, various switches (e.g., 27 a, 27 b, 28 a, 28 b)associated with operation of various PAs (e.g., 29 a, 29 b, 30 a, 30 bof the low band portion, and 29 c, 29 d, 30 c, 30 d of the high bandportion) can be fabricated as complementary metal-oxide-semiconductor(CMOS) devices. In certain embodiments, at least some of the PA biascontrol component 25 can be implemented on a CMOS die. In the exampleshown in FIG. 3A, the switches (e.g., 27 a, 27 b, 28 a, 28 b) and the PAbias control component 25 are depicted as being parts of the same CMOSdie 26. In certain embodiments, such switches and PA bias controlcomponent can be parts of different CMOS dies.

In certain embodiments, at least one power amplifier and one or moreswitches associated with its operation can be implemented on a CMOS die.FIG. 3B shows an example architecture 34 that can generally providedual-band signal amplification functionalities similar to that describedin reference to FIG. 3A. In FIG. 3B, “IN 1” and “OUT 1” can representthe low band input and output LB IN and LB out; and “IN 2” and “OUT 2”can represent the high band input and output HB IN and HB OUT. Further,switching functionality associated with switches 32 a and 32 b can beprovided by switches 37 a and 37 b. For high power mode of operation,PAs 29 a, 29 b, 29 c, 29 d that are parts of dies 36 a, 36 b can besimilar to the dies 24 a, 24 b described in reference to FIG. 3A.

In FIG. 3B, power amplifiers 38 a, 38 b, 38 c, 38 d corresponding to themedium/low power modes are depicted as being formed on the same die 35(e.g., CMOS die) on which the switches (e.g., 27 a, 27 b, 28 a, 28 b)are formed. Other than these components being on the same CMOS die,operation of the example medium/low power modes can be achieved in amanner similar to those described in reference to FIG. 3A.

Similar to FIG. 3A, the example configuration 34 of FIG. 3B includes aPA bias control component 37 that is part of the example CMOS die 35.The PA bias control component 37 is depicted as receiving one or moreinput control signals 28 and controlling one or more functionalitiesassociated with the various PAs. The PAs (e.g., 29 a, 29 b for the firstband, and 29 c, 29 d for the second band) associated with the high powermode are depicted as being controlled via bias control lines 39 a and 39b. The PAs (e.g., 38 a, 38 b for the first band, and 38 c, 38 d for thesecond band) associated with the medium/low mode are depicted as beingcontrolled via bias control lines 39 c and 39 d.

It will be understood that the configurations 22 and 34 of FIGS. 3A and3B are specific examples of design architectures that can beimplemented. There are a number of other configurations that can beimplemented utilizing one or more features of the present disclosure.

In the context of switches for RF power amplifiers, FIGS. 4A and 4Bshows a switching configuration 40 that can form a basis for morecomplex architectures. In a signal path configuration 40 a of FIG. 4A,an RF signal can be routed through a first path 42 a by providing aswitch S1 that is closed. In the configuration 40 a, second path 42 b isdepicted as having a switch S2 that is open and a power amplifier. Thus,for the purpose of operating the power amplifier in the example path 42b, the configuration 40 a can represent an OFF state.

In a signal path configuration 40 b of FIG. 4B that can represent an ONstate for the power amplifier, the switch S2 on the second path 42 b isclosed and the switch S1 on the first path 42 a is open. For the purposeof description of FIGS. 4A and 4B, the first example path 42 a isdepicted without any component other than the switch S1. It will beunderstood that there may be one or more components (e.g., one or morepower amplifiers) along the first path 42 a.

In the context of power amplifiers that can be included in portableand/or wireless devices (e.g., mobile phones), a power amplifier systemcan be subjected to varying processes and operating conditions such asvoltage and temperature variations. For example, a power amplifiersystem can be powered using a variable supply voltage, such as a batteryof a mobile phone.

In certain situations, it can be important for a power amplifier systemto switch between power modes so that the power amplifier switch cancontrol power consumption. For example, in a mobile device embodiment,having a plurality of power modes allows the power amplifier to extendbattery life. Control signals, such as mode input signals received on apin or pad, can be used to indicate a desired mode of operation. Thepower amplifier system can include a plurality of RF signal pathways,which can pass through power amplification stages of varying gain.Switches can be inserted in and/or about these pathways, and switchcontrol logic can be used to enable the switches and power amplifiersassociated with the selected power amplifier RF signal pathway.

Placing a switch in a signal path of a power amplifier (e.g., in theexample signal path 42 b of FIGS. 4A and 4B) can produce a number ofeffects. For example, insertion of a switch into a RF signal pathway canresult in a loss of signal power due to radiation and resistive losses.Additionally, even a switch in an OFF state placed along an active RFsignal pathway can attenuate a RF signal. Thus, it can be important thatthe switch introduce low insertion loss in both ON and OFF states.Furthermore, it can be important that the switch be highly or acceptablylinear, so as to reduce distortion of a RF signal which passes throughthe switch. Distortion can reduce the fidelity of an RF signal; andreduction of such distortion can be important in a mobile systemembodiment.

In certain embodiments, switches can be integrated on a mixed-transistorintegrated circuit (IC) having power amplification circuitry, such as aBiFET, BiCMOS die employing silicon or GaAs technologies. Additionally,switches can be provided on a discrete die, such as a pHEMT RF switchdie, and can be configured to interface with a mixed-transistor poweramplifier die to implement a configurable power amplifier system.However, these approaches can be relatively expensive and consumesignificant amounts of area as compared to a silicon CMOS technology.Power consumption and the area of a power amplifier system can beimportant considerations, such as in mobile system applications. Thus,there is a need for employing a CMOS switch in a RF signal poweramplifier system.

In certain embodiments, CMOS RF switches can be relatively large, sothat the switch resistance in an ON-state can be relatively small so asto minimize RF insertion loss. However, large CMOS RF switches can haveundesirable parasitic components, which can cause significant leakagesand cause damage to RF signal fidelity. Additionally, the wells andactive areas of the CMOS RF switches can have associated parasitic diodeand bipolar structures. Without proper control of the wells of a CMOS RFswitch, parasitic structures may become active and increase the powerconsumption of the power amplifier system and potentially render thesystem dysfunctional. Furthermore, CMOS devices are susceptible tobreakdown, such as gate oxide breakdown, and other reliability concerns,so it can be important to properly bias a CMOS RF switch duringoperation.

In certain embodiments, one or more switches described herein can beselectively activated depending on a variety of factors, including, forexample, a power mode of the power amplifier system. For example, in ahigh power mode a CMOS RF switch may be positioned in an OFF state andconfigured to be in a shunt configuration with the active RF signalpath. The isolated P-well voltage of such a switch can be controlled toboth prevent overvoltage or other stress conditions which may endangerthe reliability, while optimizing or improving the linearity of theswitch. The linearity of the RF signal pathway having a shunt CMOSswitch in an OFF-state can be improved by keeping the isolated P-wellvoltage at a selected voltage (e.g., relatively low voltage) so as toavoid forward biasing of parasitic diode structures formed between theP-well and the N-type diffusion regions of the source and drain. Bypreventing the forward-biasing of parasitic diode structures, theinjection of unintended current into the active RF signal pathway can beavoided, thereby increasing linearity of the power amplifier system.

In certain embodiments, some or all of the foregoing example propertiescan be addressed by one or more features associated with a CMOS RFswitch, such as a switch 50 depicted in FIG. 5. The example switch 50can include a triple-well structure having an N-well 52 and a P-well 53formed on a P-type substrate 51. As shown in FIG. 5, the N-well 52 cansurround the P-well 53 so as to electrically isolate the P-well 53 fromthe substrate 51. The N-well 52 can be formed by using, for example, adeep N-well or any other suitable N-type buried layer.

The switch 50 further includes a source terminal 56 and a drain terminal59. An oxide layer 65 is disposed on the P-well 53, and a gate 58 isdisposed on top of the oxide layer 65. An N-type source diffusion regionand an N-type drain diffusion region corresponding to the source anddrain terminals (56, 59) are depicted as regions 57 and 60,respectively. In certain embodiments, formation of the triple-wellstructure and the source, drain and gate terminals thereon can beachieved in a number of known ways.

In certain operating situations, an input signal can be provided to thesource terminal 56. Whether the switch 50 allows the input signal topass to the drain terminal 59 (so as to yield an output signal) can becontrolled by application of bias voltages to the gate 58. For example,application of a first gate voltage can result in the switch 50 being inan “ON” state to allow passage of the input signal from the sourceterminal 56 to the drain terminal 59; while application of a second gatevoltage can turn the switch 50 “OFF” to substantially prevent passage ofthe input signal.

In certain embodiments, the switch 50 can include a P-well terminal 54connected to the P-well 53 by a P-type diffusion region 55. In certainembodiments, the P-type diffusion region 55 and the N-type diffusionregions 57 and 60 can be all formed substantially in the P-well 53. Incertain embodiments, the P-well terminal 54 can be provided with one ormore voltages, or held at one or more electrical potentials, tofacilitate controlling of an isolated voltage of the P-well. Examples ofsuch P-well voltages are described herein in greater detail.

In certain embodiments, the switch 50 can include an N-well terminal 61connected to the N-well 52 by an N-type diffusion region 62. In certainembodiments, the N-type diffusion region 62 can be formed substantiallyin the N-well 52. In certain embodiments, the N-well terminal 61 can beprovided with one or more voltages, or held at one or more electricalpotentials, to provide the switch 50 with one or more desired operatingperformance features. One or more examples of such N-well voltages aredescribed herein in greater detail.

In certain embodiments, the switch 50 can include a P-type substrateterminal 63 connected to the P-type substrate 51 and having a P-typediffusion region 64. In certain embodiments, the P-type diffusion region64 can be formed substantially in the P-type substrate 51. In certainembodiments, the P-type substrate terminal 63 can be provided with oneor more voltages, or held at one or more electrical potentials, toprovide the switch 50 with one or more desired operating performancefeatures. One or more examples of such N-well voltages are describedherein in greater detail.

In the example CMOS device shown in FIG. 5, the switching functionalityof the switch 50 is generally provided by an NMOS transistor defined bythe N-type diffusion regions (57, 60) in the P-well 53. FIG. 6 showsthat for such a configuration, diodes can form at p-n junctions of thetriple well structure. For example, a diode 72 can have an anode formedfrom the P-well 53, and a cathode formed from the N-type diffusionregion 57. Similarly, a diode 73 can have an anode formed from theP-well 53 and a cathode formed from the N-type diffusion region 60.Depending on the voltage of the P-well 53 relative to the voltages ofthe N-type diffusion regions 57 and 60, the diodes 72 and 73 can bebiased in, for example, a reverse bias or forward bias region ofoperation. For the purpose of description herein, bias voltages appliedto the N-type diffusion regions 57 and 60 (corresponding to the sourceand drain terminals, respectively) may or may not be the same. Further,for the purpose of description herein, a reverse bias can include aconfiguration where a voltage associated with an N-type region is equalto or greater than a voltage associated with a P-type region that formsa p-n junction with the N-type region.

In certain embodiments, the N-type diffusion regions 57 and 60 can beheld at substantially the same DC voltage. In certain embodiment, such aconfiguration can be achieved by providing a relatively large valueshunt resistor (e.g., polysilicon resistor) 75 across the source and thedrain.

In the context of triple-well CMOS devices, the N-well 52 cansubstantially isolate the P-well 53 from the P-type substrate 51. Incertain embodiments, the presence of the N-well 52 between the P-well 53and the P-type substrate 51 can result in two additional diodes. Asshown in FIG. 6, the illustrated triple well structure can include adiode 71 having an anode formed from the P-well 53 and a cathode formedfrom the N-well 52. Similarly, the triple well structure can include adiode 70 having an anode formed from the P-type substrate 51 and acathode formed from the N-well 52.

In certain embodiments, the switch 50 can be operated so as toreverse-bias one or more of the diodes shown in FIG. 6. To maintain suchreverse-biases, the source terminal, drain terminal, gate terminal,P-well terminal, N-well terminal, P-substrate terminal, or anycombination thereof, can be provided with one or more voltages, or heldat one or more electrical potentials. In certain embodiments, suchvoltages or electrical potentials can also provide one or moreadditional functionalities that can improve the performance of theswitch 50. Non-limiting examples of such performance enhancing featuresare described herein in greater detail.

Although FIGS. 5 and 6 have described an NMOS transistor as providingthe functionality of a switch, a PMOS transistor can also be employed.

Overview of Enabled Gate Detection Systems

FIG. 7 is a schematic diagram of part of a power amplifier system 119 inaccordance with one embodiment. The power amplifier system 119 includesa switch 100 and a bias control system 120. The bias control system 120includes a p-well bias control block 121, a gate bias control block 122,and an n-well bias control block 123. The switch 100 includes asubstrate 101, substrate contacts 103, a p-well 110, p-well contacts108, n-wells 112, deep n-well 114, n-well contacts 116, a source 102, adrain 104, a gate 106, and a resistor 113. As shown in FIG. 7, thep-well bias control block 121 can provide a p-well bias voltage to thep-well 110 of the switch 100. Furthermore, the gate bias control block122 can provide a gate bias voltage to the gate 106 of the switch 100,and the n-well bias control block 123 can provide an n-well bias voltageto the n-well 112 of the switch 100. Although the bias control system120 is illustrated as biasing only a single switch 100 in FIG. 7, thebias control system 120 can be configured to bias one or more additionalswitches using either the same or different bias control blocks 121-123.

The switch 100 has been annotated to show certain parasitic diodedevices formed from the illustrated switch layout structure, includingdiodes 105, 107, 109, and 111. As will be described in further detailbelow, the p-well bias control block 121, the gate bias control block122, and the n-well bias control block 123 can be configured to bias thep-well 110, the gate 106, and the n-wells 112, respectively, to improveoperation of the switch 100 and to prevent unintended biasing of thediodes 105, 107, 109, 111.

The diode 105 includes an anode formed from the p-well 110, and acathode formed from the source 102. The diode 107 includes an anodeformed from the p-well 110 and a cathode formed from the drain 104. Theswitch 100 has been annotated to show the diode 109, which includes ananode formed from the p-well 110 and a cathode formed from the n-well112. The diode 111 includes an anode formed from the substrate 101 and acathode formed from the n-well 112.

As shown in FIG. 7, the switch 100 can include a resistor 113 having afirst end electrically connected to the source 102, and a second endelectrically connected to the drain 104. In one embodiment, the resistor113 is formed using polysilicon, and has a resistance selected to be inthe range of about 10 kΩ to about 200 kΩ. However, the resistor 113 canbe implemented in any suitable manner, including, for example, using ann-diffusion layer resistor having a length and width selected to achievea desired resistance. Inclusion of the resistor 113 can aid incontrolling signal attenuation along an active RF signal when the switchis an OFF state.

The switch 100 can be selectively controlled over a variety of powermodes and/or other operational parameters of the power amplifier system119. For example, in a high power mode the switch 100 can be positionedin an OFF state, while in a low power mode the switch 100 may beposition in an ON state. Depending on the configuration, the switch 100can be in an ON state and part of an active RF signal pathway, or can bein an OFF state in which the switch 100 is in a shunt configuration withthe active RF signal pathway. The voltages of the p-well 110, the gate106, and the n-wells 112 can be controlled over a variety of power modesand/or other operational parameters to prevent overvoltage or otherstress conditions which may endanger the reliability, and to optimizethe linearity of the switch 100.

During an ON state, the switch 100 can be biased so as to avoidovervoltage conditions, such as gate oxide breakdown, and to provide lowRF switch insertion loss. Insertion loss can be influenced by a varietyof factors, including body effect caused by the bias of the p-well 110relative to the gate 106. To prevent gate oxide breakdown and reduceinsertion loss, the biasing of the switch 100 can be controlled in theON state. For example, the voltage of the p-well 110 can selected to besubstantially equal the DC voltage of the source and drain 102, 104,while the voltage of the gate 106 can be boosted relative to the DCvoltage of the source and drain 102, 104 so as to produce an inversionlayer in the p-well 110 adjacent the gate 106, thereby reducing theresistance between the source 102 and drain 104 when the switch 100 isin the ON state.

The biasing of the switch 100 can also be controlled in an OFF state toimprove switch performance. For example, the linearity of an RF signalpathway having a shunt switch 100 in an OFF-state can be improved bykeeping the voltage of the p-well 110 at a relatively low voltage so asto avoid forward biasing the diodes 105, 107 formed between the p-well110 and the source 102 and drain 104, respectively. By preventing theforward-bias of the diodes 105, 107, the injection of unintended currentinto the active RF signal pathway can be avoided, thereby reducing powerconsumed by the switch 100 and increasing linearity of the poweramplifier system 119 in a mode in which the switch 100 is in a shuntconfiguration with the active RF signal pathway.

To keep the diodes 105, 107 under reverse bias, it can be desirable tokeep the voltage potential of the p-well 110 relatively low. However, ifa difference in voltage between the gate 106 and the p-well 110 becomestoo high, numerous problems can result, including, for example, gateoxide punch-through. Thus, in certain embodiments, both the gate 106 andthe p-well 110 voltage can be selectively decreased to simultaneouslyimprove linearity of the RF switch when in the shunt OFF statecondition, and to extend the lifetime of the RF switch by avoidinghigh-voltage gate-body and gate-diffusion stress conditions.

Additionally, in an ON state, it can be desirable to reduce switchinsertion loss while keeping the diodes 105, 107 from becoming forwardbiased. In one embodiment, the voltage of the p-well 110 can be selectedto be equal to about the voltage of the source 102 and drain 104, andthe voltage level of the gate 106 can be selectively increased to reduceresistance between the source 102 and the drain 104 of the switch 100.The p-well bias control block 121 and the gate bias control block 122can be used to regulate the voltage of the p-well 110 and the gate 106,respectively, as will be described in further detail below.

The diodes 109 and 113 can be kept under reverse bias using the n-wellbias control block 123. The n-well bias control block 123 can beconfigured to bias the n-well 112 to prevent the diodes 109, 113 frombecoming forward biased, while also biasing the n-well 112 to reducecurrent leakage and to prevent junction breakdown. One embodiment of then-well bias control block 123 can be as described below with referenceto FIG. 8C.

FIG. 8A is a schematic block diagram of a p-well bias control block 121in accordance with one embodiment. The p-well bias control block 121includes control logic 124, an oscillator 126, a charge pump 128, and amode select block 125. As shown in FIG. 8A, the control logic 124, theoscillator 126, the charge pump 128, and the bias select block 125 canbe electrically interconnected using one or more signals. Additionally,the p-well bias control block 121 can receive and/or provide one or moresignals from or to external circuitry. For example, the control logic124 can receive control signals 127 and the bias select block 125 canprovide a p-well bias voltage 129.

The control logic 124 can be configured to set one or more settings ofp-well bias control block 121. For example, the control logic 124 canenable or disable the p-well bias control block 121 based on the valueof an enable control signal. Additionally, the control logic 124 canregulate the frequency of the clock and/or skip one or more phases ofthe clock so as to control the pumping of the charge pump 128, as willbe described below. Furthermore, the control logic 124 can configure thebias select block 125 to control the voltage level of p-well bias over avariety of modes and/or power settings. For example, the control logic124 can configure the bias select block 125 so as to provide a voltagelevel equal to about a battery voltage V_(BATT) for a switch in an ONstate, and can deliver a voltage level equal to about the output voltageof the charge pump 128 for a switch in an OFF state.

The charge pump 128 can be used to regulate the voltage of the p-wellbias 129, and can have a variety of charge pump architectures. Forexample, the charge pump 128 can be a Dickson charge pump, a four-phasecharge pump, or a charge pump employing a charge-transfer-switch (CTS)topology. Additionally, the charge pump 128 can include a clock booster,a non-overlapping clock generator, a filtering capacitor, or a widevariety of other circuits to aid in improving charge pump performance.To aid in regulating the charge pump 128, a voltage or current of thecharge pump 128 can be measured by the control logic 124 using, forexample, a resistor or capacitive divider. The control logic 124 cancompare the measured value to a reference value and control theoscillator 126 based on this comparison. By controlling the oscillator126, the pump output voltage and current can be regulated to control thecharge pump output voltage to either negative or positive voltagelevels.

Although FIG. 8A illustrates only one charge pump 128, additional chargepumps can be employed. For example, two charge pumps can operate inparallel to increase current deliver capability, or two charge pumpshaving unaligned charge transfer phases can operate in a push-pullconfiguration so that the time that the p-well bias is regulated can beincreased relative to a design in which a single charge pump isemployed. Additionally multiple charge pumps can be used to provide aplurality of voltage levels which can be used by the bias select block125 to set the p-well bias 129 to a particular voltage level.

Although FIG. 8A illustrates the p-well bias control block 121 in aconfiguration in which the p-well bias level can be set to either acharge pump or battery voltage level, the p-well bias control block 121can be implemented in other ways. For example, the p-well bias controlblock 121 can be configured to provide a p-well bias voltage using anysuitable voltage regulator, including, for example, a linear regulator.Additionally, the bias select block 125 can be configured to deliverp-well bias voltages to a plurality of p-wells. For example, the p-wellbias block 121 can deliver p-well bias voltage levels to two or moreswitches, each of which can have the same or different p-well biasvoltage levels. Thus, the bias select block 125 can include a pluralityof p-well bias outputs for biasing a plurality of switches.

FIG. 8B is a schematic block diagram of a gate bias control block 122 inaccordance with one embodiment. The gate bias control block 122 includescontrol logic 134, oscillators 136 a, 136 b, charge pumps 138 a, 138 b,and a bias select block 135. The control logic 134, the oscillators 136a, 136 b, the charge pumps 138 a-138 b and the bias select block 135 canbe electrically interconnected using one or more signals, and the gatebias control block 122 can receive and/or provide one or more signalsfrom or to external circuitry. For example, the control logic 134 canreceive control signals 137, and the bias select block 135 can provide agate bias voltage 139. Additional details of the control logic 134, theoscillators 136 a, 136 b, and the charge pumps 138 a, 138 b can besimilar to those described above with reference to FIG. 8A.

The bias select block 135 can set the gate bias 139 to a variety ofvoltage levels. For example, the bias select block 135 can set the gatebias 139 to the output voltage level of the charge pump 138 a or to theoutput voltage level of the charge pump 138 b. The bias select block 135can receive one or more power supplies, ground supplies, or outputs ofvoltage regulators as inputs to aid in setting the gate bias 139 to aparticular voltage level. Configuring the bias select block 135 toreceive additional voltages can aid in setting the gate bias 139 to adesired voltage level associated with a particular switch state and/orpower mode. For example, the bias select block 135 can deliver a boostedgate voltage to a switch in the ON state, and a relatively low voltagelevel to a switch in the OFF state. These voltage levels can be selectedby controlling the output voltage levels of the charge pumps 138 a, 138b.

The gate bias control block 122 can be configured to deliver gate biasvoltages to a plurality of switches. For example, the gate bias block122 can deliver gate bias voltage levels to two or more switches, eachof which can have the same or different gate bias voltage levels. Thus,the bias select block 135 can include a plurality of gate bias outputsfor biasing a plurality of switches.

With reference to FIGS. 8A-8B, in certain embodiments, the p-well biascontrol block 121 and the gate bias control block 122 can share one ormore blocks so as to reduce circuit area and simplify design complexity.For example, the oscillator 136 b and the charge pump 138 b can beomitted from the gate bias control block 122, and the bias select block135 of the gate bias control block 122 can be configured to receive theoutput of the charge pump 128 of the p-well bias control block 121. Thiscan permit the gate bias control block 122 and the p-well bias controlblock 121 to have a substantially equal gate bias 139 and p-well bias129, such as when biasing a switch in an OFF state. Sharing one or moreblocks between the p-well bias control block 121 and the gate biascontrol block 122 can aid in reducing circuit area and complexity.

FIG. 8C is a schematic block diagram of an n-well bias control block 123in accordance with one embodiment. The gate bias control block 122includes control logic 144, an oscillator 146 a a charge pumps 143 a.The control logic 144, the oscillator 146 a and the charge pump 143 acan be electrically interconnected using one or more signals, and then-well bias control block 123 can receive and/or provide one or moresignals from or to external circuitry. For example, the control logic144 can receive control signals 147, and the charge pump 143 a canprovide a gate bias voltage 141. Additional details of the control logic144, the oscillator 146 a, and the charge pump 143 a can be similar tothose described above with reference to FIG. 8A.

The n-well bias 141 of the n-well bias control block 123 can bedetermined by the output of the charge pump 143 a. The charge pump 143 acan be configured to output a relatively high voltage so as to preventthe unintended forward biasing of parasitic diodes in switches receivingn-well bias 141. To provide additional control over the n-well bias 141,a bias select block 145, an oscillator 146 b, and a charge pump 143 bcan also be included. The bias select block 145 can be configured toreceive the outputs of the charge pumps 143 a, 143 b to aid in providinga desired voltage level to the n-well bias 141. The n-well bias 141 canbe provided to one or more switches, similar to that described above.The voltage level of the n-well bias 141 can be varied to prevent theforward biasing of parasitic diode structures while also biasing then-well bias 141 to reduce current leakage and to prevent junctionbreakdown.

FIG. 9 is a schematic diagram of a power amplifier system 149 inaccordance with another embodiment. The illustrated power amplifiersystem 149 includes a switch 100, a bias control system 160, and a poweramplifier 140. The switch 100 includes a substrate 101, substratecontacts 103, a p-well 110, p-well contacts 108, n-wells 112, deepn-well 114, n-well contacts 116, a source 102, a drain 104, a gate 106,and a resistor 113. The switch 100 has been annotated to show certainparasitic diode devices formed from the illustrated switch structure,including diodes 105, 107. Additional details of the switch 100 can beas described above.

The power amplifier 140 includes an input for receiving an RF inputsignal, and an output for generating an RF output signal, which can bean amplified version of the RF input signal. The power amplifier 140 canprovide the RF output signal to the source 102 of the switch 100. Thepower amplifier 140 can receive one or more control signals, includingan enable signal from the bias control system 160.

The bias control system 160 includes a p-well bias control block 121, agate bias control block 122, a switch enable detect block 148 and apower amplifier control block 150. As shown in FIG. 9, the p-well biascontrol block 121 can provide a p-well bias voltage to the p-well 110 ofthe switch 100, and the gate bias control block 122 can provide a gatebias voltage to the gate 106 of the switch 100. The gate bias voltagecan also be provided to the switch enable detect block 148, which can beconfigured to compare the gate bias voltage to a reference voltage Vx.The switch enable detect block 148 can generate a power amplifier enablesignal based on this comparison, which can be provided to the poweramplifier bias control block 150. The power amplifier bias control block150 can be configured to control the bias of one or more poweramplifiers, such as the power amplifier 140.

The power amplifier 140 can provide a quiescent current to the switch100, even before the power amplifier 140 receives an RF input signal foramplification. The quiescent current can be provided to the switch 100,and a portion of the quiescent current can travel through the resistor113. If the voltage drop across the resistor 113 is relatively large,the diode 107 can become forward biased and the switch 100 can drawnunnecessary current, which can increase insertion loss and reduce poweramplifier gain.

To decrease the resistance between the source 102 and drain 104, thevoltage level of the gate 106 can be increased before the poweramplifier 140 is enabled. This can create a path for the quiescentcurrent to travel which is in parallel to the current path provided bythe resistor 113. By providing a sufficient voltage to the gate 106before enabling the power amplifier 140, the resistance between thesource 102 and drain 104 can be decreased before the switch 100 receivesa quiescent current from the power amplifier 140 and the diode 107 canbe prevented from becoming forward biased.

The switch enable detect block 148 can be used for controlling the poweramplifier bias control block 150 to prevent the unintended forwardbiasing of the diode 107. For example, the switch enable detect block148 can compare the level of the gate 106 to a reference voltage Vx thatis indicative of the switch 100 being in an ON state. The switch enabledetect block 148 can generate a comparison signal indicative of theresult, and provide the comparison signal to the power amplifier biascontrol block 150. The power amplifier bias control block 150 can beconfigured to enable the power amplifier 140 after the comparison signalindicates the switch 100 is in an ON state.

Although the switch enable detect block 148 is shown as comparing thevoltage level of the gate 106 to a reference voltage Vx, there arenumerous other ways to indirectly compare the voltage level of the gateto a reference voltage without directly comparing the two voltagevalues. For example, in one embodiment, the gate bias control block 122can us an enable or other control signal indicative of the voltage levelof the gate 106 as a reference voltage signal. In another embodiment,the switch enable detect block 148 can compare a signal indicative ofthe gate being enabled, such as, for example, a current through or avoltage across a resistor or other device, which has a calculablerelationship to the gate voltage level.

In one embodiment, the reference voltage Vx is selected to be equal toabout the threshold voltage Vt of the switch 100. The threshold voltageVt of the switch 100 can be the voltage at which an inversion layerforms on the surface of the p-well 110 adjacent the gate 106. Byselected the reference voltage Vx to be equal to about Vt of the switch100, the switch enable detect block 148 can be configured to detect ifthe gate voltage is at a voltage level greater than or equal to aboutVt, which can correspond to the formation of an inversion layer in theswitch 100 and a relatively low resistance between the source 102 anddrain 104.

FIG. 10A is a schematic block diagram of a power amplifier system 151 inaccordance with another embodiment. The illustrated power amplifiersystem 151 includes a first power amplifier 140 a, a second poweramplifier 140 b, a third power amplifier 140 c, a first switch 100 a, asecond switch 100 b, a third switch 100 c, and a bias control system161. The bias control system 161 includes a switch enable detect block156 and a power amplifier bias control block 150. As shown in FIG. 10A,the power amplifiers 140 a-140 c can drive the switches 100 a-100 c,respectively. Voltages indicative of the gate voltages of the switches100 a-100 c can be provided to the switch enable detect block 156.Additionally, the switch enable detect block can receive one or morevoltages indicative of the p-well voltages of the switches 140 a-140 c.

The switch enable detect block 156 can compare the gate voltages of theswitches 100 a-100 c to the p-well voltages of the switches 100 a-100 cto generate one or more signals indicative of the switches 100 a-100 cbeing enabled. The signals can be provided to a power amplifier biascontrol block 150, which can control one or more power amplifiers,including, for example, the power amplifiers 140 a-140 c. Thus, the biascontrol system 161 can be configured to enable the power amplifiers 140a-140 c after the switches 100 a-100 c are activated, thereby preventingthe switches 100 a-100 c from receiving quiescent currents associatedwith the power amplifiers 140 a-140 c before being enabled. AlthoughFIG. 10A illustrates a configuration in which the gate and p-wellvoltages of three switches are compared, the switch enable detect block156 can be configured to monitor more or fewer switches.

FIG. 10B is a schematic block diagram of a power amplifier system 152 inaccordance with another embodiment. The illustrated power amplifiersystem 152 includes a first power amplifier 140 a, a second poweramplifier 140 b, a third power amplifier 140 c, a first switch 100 a, asecond switch 100 b, a third switch 100 c, and a bias control system162. The bias control system 162 includes a p-well bias control block121, a switch enable detect block 158, a level shifter 159, and a poweramplifier bias control block 150. As shown in FIG. 10B, the poweramplifiers 140 a-140 c can drive the switches 100 a-100 c, respectively.Voltages indicative of the gate voltages of the switches 100 a-100 c canbe provided to the switch enable detect block 158. The p-well biascontrol block 121 can provide a p-well bias to the switches 100 a-100 cand to the switch enable detect block 158.

The switch enable detect block 158 can compare the gate voltages of theswitches 100 a-100 c to the p-well voltage generated by the p-well biascontrol block 121. This can be accomplished using a digital logic gate,such as a NOR gate, as shown in FIG. 10B. For example, the NOR gate caninclude logic connected between a positive supply and a negative supply.The positive supply can be a relatively high voltage of the chip and canbe, for example, equal to about the voltage of the gate of a switch inthe enabled state. In embodiments in which a charge pump is used tosupply the gate voltages of switches in the enabled state, the output ofthe charge pump can be used as the positive supply of the switch enabledetect block 158. The negative supply can be configured to receive thep-well bias voltage. Thus, the switch enable detect block 158 can detectif at least one of the gate voltages of the switches 100 a-100 c isgreater than the p-well bias voltage by at least about a thresholdvoltage Vt of the switches.

The output of the switch enable detect block 158 can be provided to alevel shifter 159. The level shifter can reduce the voltage of thedetected signal before providing the signal to the power amplifier biascontrol block 150. Reducing the voltage of the enable signal can beuseful in embodiments in which the positive voltage supply of the switchenable detect block 158 exceeds the operating voltage of the poweramplifier bias control block 150. For example, the power amplifier biascontrol block 150 can include one or more transistors having relativelythin gate oxides, and which can be susceptible to damage or reliabilityconcerns if exposed to a relatively large voltage.

As described above, the switch enable detect block can include one ormore digital logic gates configured to compare the gate voltage of oneor more switches to the p-well bias voltage of one or more switches.Using digital logic techniques can reduce the complexity, area and powerconsumption of the switch enable detect block relative to an embodimentin which more sophisticated circuitry is employed. Although the switchenable detect block 158 is illustrated as a NOR gate in FIG. 10B, otherdigital logic gates can be used. For example, an inverter can be used tocompare the gate voltage of a switch to the p-well bias voltage of theswitch. Additionally, a NAND gate or other gate can be utilized if adifferent logic function is desired. For example, a NAND gate can beused to determine if all switches are enabled, rather than detecting theenablement of at least on of the switches 140 a-140 c.

In one embodiment, the switch enable detect block 158 is configured todetect a voltage level of about n*Vt above the voltage of the p-well,wherein n is an integer greater than or equal to one. This can beaccomplished, for example, by inserting n−1 elements having a voltagedrop equal to about Vt in series between the negative voltage supply ofthe switch enable detect block 158 and the p-well bias control block121. For example, a NMOS device having a gate, a drain and a source canbe connected in a diode configuration in which the gate and drain areelectrically connected, and can have a voltage drop equal to about Vt.Accordingly, n−1 diode connected NMOS devices can be inserted in seriesbetween the negative voltage supply of the switch enable detect block158 and the p-well bias control block, so that the switch enable detectblock 158 can detect a voltage level of the gates of the switches 100a-100 c greater than about n*Vt of the p-wells of the switches 100 a-100c. By detecting increasingly higher voltage levels of the gate voltagerelative to a p-well voltage of a switch, a channel resistance of theswitch can achieve a selected value before the switch receives aquiescent current from a power amplifier.

FIG. 11 is a method 180 for biasing a power amplifier system inaccordance with one embodiment. The method 180 is depicted from thepoint of view of a bias control system for a power amplifier system. Itwill be understood that the methods discussed herein may include greateror fewer operations and the operations may be performed in any order, asnecessary. The illustrated method can be used to bias, for example, thepower amplifier systems illustrated in FIGS. 3A-3B.

The method 180 for biasing a power amplifier system starts at 182. In anensuing block 184, one or more power amplifiers are set in a disabledstate. The power amplifiers can be configured to drive one or moreswitches. As described earlier, a power amplifier can provide aquiescent current to an associated switch, even before the poweramplifier receives an RF input signal for amplification. The quiescentcurrent can reach the switch, and can cause a voltage drop between theinput and output of the switch. If the resistance of the channel of theswitch is sufficiently high, the voltage drop can be large enough toforward bias a parasitic diode associated with the output of the switch.By disabling the power amplifiers in block 184, quiescent currents areprevent from being provided to the switches. This can prevent the switchfrom drawing current through a parasitic diode formation, therebypreventing an increase in power consumption, an increase insertion lossand a reduction in power amplifier gain.

The method 180 continues at a step 186, in which a signal indicative ofthe gate voltage of a switch is measured. The signal can be the gatevoltage of the switch itself. However, the signal can also be a signalindicative of the gate voltage of the switch, such as an enable signalto a gate bias control block configured to bias the gate voltage of theswitch. Alternatively, the signal can be a current through or a voltageacross a resistor or other device, which has a calculable relationshipto the gate voltage level.

In an ensuing block 188, the measured signal is compared to a referencesignal. The measured signal can be compared to the reference signal byproviding both signals to a comparator. Alternatively, the measuredsignal can be compared to the reference signal using a digital logicgate. For example, a reference voltage, such as a p-well voltage of aswitch, can be configured to operate as a negative voltage supply of adigital logic gate, such as an inverter or NOR gate, and an input of thedigital logic gate can receive the measured voltage. The digital logicgate can be configured to transition if the measured voltage is greaterthan about the threshold voltage Vt of a transistor.

The method 180 continues at a decision block 190, in which the biascontrol system determines if the gate of one or more switches isenabled. This can be determined, for example, by using the result of acomparator or digital logic gate configured to compare the measuredsignal to the reference signal. For example, in one embodiment a digitalgate is configured to determine if the measured signal is at least a Vtabove the reference signal. In another embodiment, the measured signalis compared to the reference signal using an analog comparator circuit.If the answer to the inquiry in the decision block 190 is no, the methodreturns to the block 186. If the answer to the inquiry in the decisionblock 190 is yes, the method proceeds to the block 192, in which one ormore power amplifiers is set in an enabled state. As described above,ensuring the gate of a switch is enabled before enabling a poweramplifier can aid in enabling a gate of a switch before the switchreceives a quiescent current of the power amplifier. This can preventthe forward bias of parasitic diode structures in the switch. The methodends at 194.

Overview of N-Diffusion Sensing Systems

FIG. 12 is a schematic diagram of part of a power amplifier system 200in accordance with another embodiment. The power amplifier system 200includes a switch 100, a power amplifier 140, and a bias control system210. The bias control system 210 includes a p-well bias control block121 and a switch sense block 222. The switch 100 includes a substrate101, substrate contacts 103, a p-well 110, p-well contacts 108, n-wells112, deep n-well 114, n-well contacts 116, a source 102, a drain 104, agate 106, and a resistor 113. Additional details of the switch 100 canbe as described above. The power amplifier 140 can receive an RF inputsignal, and can amplify the RF input signal to produce an RF outputsignal. The source 102 of the switch 100 can be configured to receivethe RF output signal from the power amplifier 140.

The p-well bias control block 121 can provide a p-well bias voltage tothe p-well 110 of the switch 100, and the switch sense block 222 can beelectrically connected to the switch input and/or output of the switch100. Additional details of the switch sense block 222 will be describedbelow. Although the bias control system 120 is illustrated as biasingonly a single switch 100 in FIG. 12, the bias control system 210 canbias one or more additional switches.

The switch 100 has been annotated to show certain devices formed fromthe illustrated switch layout structure, including diodes 105, 107. Thediode 105 includes an anode formed from the p-well 110, and a cathodeformed from the source 102. The diode 107 includes an anode formed fromthe p-well 110 and a cathode formed from the drain 104. As will bedescribed in further detail below, the p-well bias control block 121 canbias the p-well 110 to provide enhanced control over the switch 100 andto prevent unintended biasing of the diodes 105, 107.

The power amplifier 140 can bias the source 102 of the switch 100. Forexample, the power amplifier 140 can include an RF choke 224 to bias thesource 102 of the switch 100. The RF choke 224 can be, for example, aninductor configured to provide a DC bias voltage to source 102 whilehaving relatively high impedance for RF signals.

Without sufficiently controlling the p-well bias control block 121,there can be a danger that the p-well bias control block 121 can biasthe voltage of the p-well 110 before the power amplifier 140 biases thesource 102 of the switch 100. For example, the power amplifier 140 andthe p-well bias control block 121 can be electrically connected todifferent voltage supplies to prevent switching noise generated by thepower amplifier 140 from being injected into the p-well bias controlblock 121. Thus, the p-well bias control block can be electricallyconnected to a power supply V_(CC1) and the power amplifier can beelectrically connected to a power supply V_(CC2). Accordingly, there canbe a danger that the p-well bias control block 121 can bias the p-well110 before the power amplifier 140 receives power. This can result inthe diodes 105 and/or the diode 107 becoming forward biased.

It can be difficult to control the sequencing of the power suppliesV_(CC1) and V_(CC2), such as in embodiments where the power amplifier140 and the p-well bias control block 121 are on different dies. Forinstance, with reference back to FIG. 3A, the power amplifier can bepresent on die 24 a and the switch 100 and p-well bias control block 121can be present on die 23. Thus, the die 23 may receive power before thedie 24 a. Additionally, in certain embodiments, the die 23 may not havea pin or pad configured to receive the supply voltage V_(CC2), and thuscannot directly measure the supply voltage V_(CC2).

In one embodiment, the switch sense block 222 is configured to sense thesource 102 and/or drain 104 of the switch 100, and to provide one ormore signals indicative of the result to the p-well bias control block121. The p-well bias control block 121 can be configured to bias thep-well 100 after the switch sense block 222 has determined that thesource 102 and/or drain 104 is greater than a preselected referencevoltage level. Thus, the switch sense block 222 can be advantageouslyemployed to prevent the forward biasing of diodes 105, 107.

FIG. 13A is a schematic block diagram of a power amplifier system 230 inaccordance with another embodiment. The power amplifier system 230includes a bias control system 210 and a switch 100. The bias controlsystem 210 includes a switch sense block 222 and a p-well bias controlblock 210. As shown in FIG. 13A, the p-well bias control block 121 canbe configured to provide a p-well bias voltage to the switch 100. Theswitch sense block 222 can be configured to monitor a voltage of theinput switch, and can be configured to provide one or more controlsignals to the p-well bias control block 121. Although the switch senseblock 222 is illustrated as monitoring only a single switch 100, theswitch sense block 222 can monitor additional switches. The same ordifferent p-well bias control block 121 can be used to bias the p-wellvoltage of the additional switches. As shown in FIG. 13A, the switchsense block 222 can be configured to detect the voltage level at theinput of the switch 100.

FIG. 13B is a schematic block diagram of a power amplifier system 231 inaccordance with another embodiment. The power amplifier system 231includes a bias control system 210 and a switch 100. The power amplifiersystem 231 is similar to the power amplifier system 230 of FIG. 13A,except the power amplifier system 231 includes a switch sense block 222configured to receive the output of the switch 100.

FIG. 13C is a schematic block diagram of a power amplifier system 232 inaccordance with another embodiment. The power amplifier system 232includes a bias control system 211 and a switch 100. The bias controlsystem 211 includes a switch sense block 222. The switch sense block 222can be configured to monitor a voltage of the input switch. In contrastto the power amplifier system 230 of FIG. 13A, the power amplifiersystem 231 of FIG. 13C need not include a p-well bias control system.For example, the switch 100 of FIG. 13C can have a floating p-well andthe bias of the n-diffusion can be controlled over a variety of powermodes and/or switch settings to prevent forward biasing of parasiticdiode structures. The switch sense block 222 can be used to detect thevoltage at the input to the switch, which can, for example, aid inbiasing the switch 100.

FIG. 13D is a schematic block diagram of a power amplifier system 233 inaccordance with another embodiment. The power amplifier system 233includes a bias control system 211 and a switch 100. The power amplifiersystem 233 is similar to the power amplifier system 232 of FIG. 13C,except the power amplifier system 233 includes a switch sense block 222configured to receive the output of the switch 100.

FIG. 13E is a schematic block diagram of a power amplifier system 234 inaccordance with another embodiment. The power amplifier system 234includes a bias control system 212 and a switch 100. The power amplifiersystem 234 includes a p-well bias control block 212 configured to biasthe p-well of switch 100. In contrast to the power amplifier systems ofFIGS. 13A-13D, the power amplifier system 234 of FIG. 13E need notinclude a switch sense block 222. The power amplifier system 234 canreceive the input of the switch 100 to aid in biasing and control of theswitch 100.

The power amplifier system can receive the output of the switch 100 toaid in biasing and control of the switch 100.

Although the power amplifier systems 230-234 of FIGS. 13A-13E are shownas receiving either the input or output of the switch 100, the poweramplifier systems can be configured to receive both the input and outputof the switch 100 to further aid in biasing and controlling of theswitch 100.

FIGS. 14A-14B are schematic block diagrams of various embodiments ofswitch sense blocks. One or more of the switch sense blocks of FIGS.14A-14B can be used in the power amplifier systems described above, andeach switch sense block can be electrically to the input or output of aswitch. The outputs of the switch sense blocks can be connected tocontrol logic or other circuitry to aid in biasing the one or moreswitches.

FIG. 14A is a schematic block diagram of a switch sense block 239 inaccordance with one embodiment. The switch sense block 239 includes afilter 238 and a voltage detector 236. The switch sense block 239 can beelectrically connected to the source or drain of a switch, and thus canreceive an RF signal 237 from a power amplifier or other source. The RFsignal 237 can include an AC component and a DC component. The filter238 can be a low-pass filter configured to filter at least a portion ofthe AC component of the RF signal 237 and provide the filtered signal tothe voltage detector 236. The voltage detector 237 can compare theoutput of the filter 238 to a reference voltage level, and provide anoutput signal indicative of the comparison. The output of the voltagedetector 237 can be provide to one or more blocks, such as the p-wellbias control block 121 of FIGS. 12-13B.

FIG. 14B is a schematic block diagram of a switch sense block 240 inaccordance with another embodiment. The switch sense block 240 includesa filter 248 and a voltage detector 246, and can receive a RF signal 237as described above. The filter 248 includes a resistor 241 and acapacitor 242. The resistor includes a first end electrically configuredto receive the RF signal 237, and a second end electrically connected tothe voltage detector 246 and to a first terminal of the capacitor 242.The capacitor 242 further includes a second terminal electricallyconnected to a supply voltage. The resistor 241 and capacitor 242 canattenuate the power of the RF signal 237 at a cutoff frequency equal toabout 1/(2πRC) Hertz. Thus, the resistance of the resistor 241 and thecapacitance 242 can be selected based on the frequency of the RF signal237, which can be determined, for example, based on a communicationstandard used to generate the RF signal 237.

The voltage detector 246 includes an inverter 243 having an inputconfigured to receive a filtered signal from the filter 248, and anoutput for providing a switch sense signal to one or more blocks, suchas one or more p-well bias control blocks 121. The inverter 243 can beconfigured to operate on a power supply greater than the DC voltage ofthe RF signal 237, and have a trip point selected to be below the DCvoltage of the RF signal 237. Thus, the switch sense block 240 can beconnected to the input or output of a switch, and can determine if theinput or output of the switch is biased by a power amplifier.Accordingly, with reference back to FIG. 12, the switch sense block 240can be employed to prevent the p-well bias control block 121 frombiasing the p-well 100 before the power amplifier 140 biases the source102 of the switch 100. This can prevent the forward biasing of diodes105, 107, as describe earlier.

The switch sense block can use other filters or voltage detectionblocks. For example, the filter 238 can be a multi-pole filter with orwithout an amplifier. Likewise, the voltage detector block can be acomparator or any other suitable block.

FIG. 15 is a method 250 for biasing a power amplifier system inaccordance with one embodiment. The method 250 is depicted from thepoint of view of a bias control system for a power amplifier system. Itwill be understood that the methods discussed herein may include greateror fewer operations and the operations may be performed in any order, asnecessary. The illustrated method can be used to bias, for example, thepower amplifier systems illustrated in FIGS. 3A-3B and 12-13B.

The method 250 for biasing a power amplifier system starts at 252. In anensuing block 254, one or more p-well bias controllers are set in adisabled state. The p-well bias controllers can bias the p-wells of oneor more switches. As described earlier, a power amplifier can provide abias voltage to an input of an associated switch using, for example, anRF choke. The switch can include a resistor which can bias the output ofthe switch to a bias voltage equal to about the input bias voltage. Bydisabling a p-well bias control block in block 254, the p-well biascontrol block is prevented from activating before the power amplifiers,thereby preventing unintended forward-biasing of parasitic diode devicesassociated with the switch.

The method 250 continues at a block 256, in which a signal indicative ofthe input and/or output voltage of a switch is filtered. For example,the switch input or output voltage can be filtered using a low passfilter. Alternatively, the signal can be a current through or a voltageacross a resistor or other device, which has a calculable relationshipto the switch input or output voltage level.

In an ensuing block 258, the filtered switch input or output voltage ismeasured. In decision block 260, the measured switch input or outputvoltage is compared to a reference voltage. This comparison can beperformed using an inverter configured to receive the filtered switchvoltage and compare the filtered switch voltage to the trip pointvoltage of the inverter. However, this comparison can be performed inother ways. For example, the filtered switch voltage can be provided toan analog comparator. If the measured switch voltage is less than areference voltage, the method 250 returns to the block 258.

If the measured switch voltage is greater than the reference voltage,the method 250 proceeds to a block 262, in which one or more p-well biascontrollers are set in an enabled state. As described above, ensuringthe input or output of a switch is biased before enabling a p-well biascontroller can aid in preventing the forward biasing of parasitic diodestructures in the switch. The method ends at 264.

Overview of P-Well Buffer Systems

FIG. 16 is a schematic diagram of a power amplifier system 300 inaccordance with another embodiment. The power amplifier system 300includes a switch 100, a bias control system 310 and a power amplifier140. The bias control system 310 includes a p-well bias control block121, a gate bias control block 122, and a buffer circuit 301. The switch100 includes a substrate 101, substrate contacts 103, a p-well 110,p-well contacts 108, n-wells 112, deep n-well 114, n-well contacts 116,a source 102, a drain 104, a gate 106, and a resistor 113. The switch100 has been annotated to show certain parasitic diode devices formedfrom the illustrated switch layout structure, including diodes 105, 107.Additional details of the switch 100 can be as described earlier.

The p-well bias control block 121 can provide a p-well bias voltage tothe p-well 110 of the switch 100 through the buffer circuit 301, and thegate bias control block 121 can provide a gate bias voltage to the gate106 of the switch 100. Although the bias control system 120 isillustrated as biasing only a single switch 100 in FIG. 16, the biascontrol system 120 can be configured to bias one or more additionalswitches using either the same or different bias control blocks 121,122.

As was described earlier, the switch 100 can be selectively biaseddepending on the state of the switch. For example, the switch 100 can bebiased in an OFF state in which the p-well voltage and the gate voltageare both relatively low. Additionally, the switch 100 can be biased inan ON state in which the p-well voltage is set at a relatively highvoltage, such as a voltage equal to about that of the source 102 anddrain 104, and the gate voltage can be placed at an even greater voltageso as to form a conductive channel between the source 102 and drain 104.When transitioning from an OFF state to an ON state, or when setting theswitch in an ON state during start-up of the power amplifier system 300,the p-well bias control block 121 and the gate bias control block 122can increase the voltages of the p-well 110 and the gate 106,respectively.

In certain embodiments, the capacitance of the gate 106 can be greaterthan the capacitance of the p-well 100. Thus, if the p-well bias controlblock 121 and gate bias control block 122 are not sufficientlycontrolled, there can be a danger that the voltage of the p-well 110 mayrise faster than the voltage of the gate 106 and that the poweramplifier 140 provides a quiescent current to the switch 100 before theswitch 100 is biased in the ON state. The quiescent current can bereceived at the source 102 of the switch 100 and can travel across theresistor 113. The voltage drop across the resistor 113 can be relativelylarge and can reduce the voltage of the drain 104, therebyforward-biasing the diode 107.

In one embodiment, the buffer circuit 301 is included between the p-wellbias control block 121 and the p-well 110 of the switch 100. Inclusionof the buffer circuit 301 can increase the impedance between the p-wellbias control block 121 and the p-well 110, thereby reducing the risetime of the voltage of the p-well 110 relative to that of the gatevoltage 106 and improving control of the biasing of the switch 100.

FIG. 17A is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with one embodiment. The illustrated p-wellbias control block 121 includes a resistor 302 configured to serve asbuffer circuit. The resistor 302 includes a first end electricallyconnected to the p-well bias control block 121, and a second endconfigured to deliver a p-well bias voltage. The resistor 302 can beconfigured to have a relatively high resistance, so as to increase theimpedance between the p-well bias control block 121 and one or morep-wells that the p-well bias control block 121 is configured to bias. Inone embodiment, the resistor 302 has a resistance ranging between about10 kΩ to about 200 kΩ.

FIG. 17B is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with another embodiment. The illustratedp-well bias control block 121 includes a transconductance amplifier 303configured to serve as buffer circuit. The transconductance amplifier303 includes a positive input, a negative input, and an output. Theamplifier output is configured to deliver a current to one or morep-wells. By adjusting the voltage of the positive input relative to thevoltage of the negative input, the amount of current generated by thetransconductance amplifier 303 can be controlled. As shown in FIG. 17B,the p-well bias control block 121 can control the positive and negativeinput of the amplifier 303 to control the current delivered to thep-well, and can receive the p-well bias voltage to aid in improvingcontrol of the amplifier 303.

FIG. 17C is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with yet another embodiment. Theillustrated p-well bias control block 121 includes a operationalamplifier 304 configured to serve as buffer circuit. The operationalamplifier 304 includes a positive input, a negative input, and anoutput. The amplifier output is configured to deliver a voltage to oneor more p-wells. By adjusting the voltage of the positive input relativeto the voltage of the negative input, the amount of current generated bythe operational amplifier 304 can be controlled. The p-well bias controlblock 121 can control the positive and negative input of the amplifier303 to control the current delivered to the p-well, and can receive thep-well bias voltage to aid in improving control of the amplifier 304.

FIG. 17D is a schematic diagram of a p-well bias control block having abuffer circuit in accordance with yet another embodiment. Theillustrated p-well bias control block 121 includes a current controlledcurrent source 305 configured to serve as buffer circuit. The currentcontrolled current source 305 can deliver a current to one or morep-wells, which can be adjusted the p-well bias control block 121. Thep-well bias control block 121 can receive the p-well bias voltage to aidin improving control of the current controlled current source 305.

Although FIGS. 17-17D illustrate four implementations of a buffercircuit for a p-well bias control block, other configurations arepossible. For example, a current controlled voltage source can be placedin a negative feedback configuration having a controlled output drive.

Overview of P-Well Bias Disable Systems

FIG. 18 is a power amplifier system 315 in accordance with anotherembodiment. The power amplifier system 315 includes a switch 100, apower amplifier 140 and a bias control system 320. The bias controlsystem 320 includes a p-well bias control block 121 and a buffer circuit301. The switch 100 includes a substrate 101, substrate contacts 103, ap-well 110, p-well contacts 108, n-wells 112, deep n-well 114, n-wellcontacts 116, a source 102, a drain 104, a gate 106, and a resistor 113.The switch 100 has been annotated to show certain devices formed fromthe illustrated switch layout structure, including diodes 105, 107.Additional details of the switch 100 can be as described earlier.

The p-well bias control block 121 can provide a p-well bias voltage tothe p-well 110 of the switch 100 through the buffer circuit 301, as wasdescribed above with reference to FIG. 16. Additionally, the output ofthe power amplifier 140 can be electrically connected to the switch 100.

The buffer circuit 321 can increase the impedance between the p-wellbias control block 121 and the p-well 110. When the power amplifier 140is enabled, the voltage provided by the power amplifier 140 to thesource 102 of the switch 100 can vary. For example, when the poweramplifier 140 is enabled, a transient signal 327 can be generated by thepower amplifier 140 and can reach the switch 102. The transient signal327 can affect the bias of the source 105. Furthermore, the transientsignal 327 can travel through the resistor 113, and can result in avoltage drop at the drain 104. Thus, there is a danger that thetransient signal 327 may forward bias diodes 105, 107.

In one embodiment, the p-well bias control block 121 is configured toinclude a disable function for preventing an unintended forward bias ofdiodes 105, 107, such as can happen during startup or operation. Thedisable function can be used to fix the voltage of the p-well 110 at arelatively low voltage. This can prevent the forward biasing of thediodes 105, 107 during start-up, even in the event of an n-diffusiontransient swing at turn-on of the quiescent current of the poweramplifier 140.

FIG. 19A is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with one embodiment. As shown inFIG. 19A, the p-well bias control block 121 can provide an output to adisable circuit 321. The disable circuit 321 can provide the output tothe buffer circuit 301, or to vary the output to a value associated witha disabled state. The buffer circuit 301 can receive the output from thedisable circuit 321, and can generate the p-well bias control voltage,as was described above.

FIG. 19B is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with another embodiment. Thep-well bias control block 121 can provide an output to a disable circuit321, which in turn can provide an output to the buffer circuit 321. Thedisable circuit 321 can include a PMOS transistor 323 and an NMOStransistor 323, each having a gate, a drain, and a source. The source ofthe PMOS transistor 323 can be electrically connected to the output ofthe p-well bias control block 121, and drain of the PMOS transistor 323can be electrically connected to the drain of the NMOS transistor 324.The source of the NMOS transistor 324 can be electrically connected to aground voltage, and the gate of the NMOS transistor 324 can beelectrically connected to the gate of the PMOS transistor 323. The gatesof the PMOS and NMOS transistors 323, 324 can be controlled by a disablesignal.

Before powering one or more power amplifiers, the disable circuit 322can be placed in a disabled state in which the p-well bias controlvoltage can be biased at a relatively low voltage level, such as aground voltage. Thereafter, the power amplifiers can be enabled and cangenerate a transient signal 327. However, by holding the p-well biascontrol voltage in a disabled state, parasitic diodes structures of theswitches are prevented from being forward-biased. After initializationof the power amplifiers, the disable circuit 322 can be deactivated, andthe p-well bias control block 121 can control the buffer circuit 301 togenerate the p-well bias voltage desired for the selected state of theswitch.

FIG. 19C is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with yet another embodiment. Thep-well bias control block 121 can provide an output to a buffer circuit301, which in turn can provide an input to a disable circuit 321. Incontrast to the disable circuit of FIGS. 19A-19B, the disable circuit321 of FIG. 19C is positioned before the buffer circuit 321. Thepositioning of the disable circuit 321 relative to the buffer circuit301 can be selected based on a number of factors, including the designof the buffer circuit 301 and the disable circuit 321.

FIG. 19D is a schematic block diagram of a p-well bias control blockhaving a disable circuit in accordance with still yet anotherembodiment. The p-well bias control block 121 can provide an output to adisable circuit 321. In contrast to the disable circuit of FIGS.19A-19C, the disable circuit 321 of FIG. 19D need not include buffercircuit 321. In certain embodiments of the p-well bias control block121, such as in embodiments in which the output resistance of the p-wellbias control block 121 is relatively high, a disable circuit 321 can beincluded.

FIG. 20 is a method 330 for biasing a power amplifier system inaccordance with another embodiment. The method 330 is depicted from thepoint of view of a bias control system for a power amplifier system. Itwill be understood that the methods discussed herein may include greateror fewer operations and the operations may be performed in any order, asnecessary. The illustrated method can be used to bias, for example, thepower amplifier systems illustrated in FIGS. 3A-3B and FIG. 18.

The method 330 for biasing a power amplifier system starts at 332. In anensuing block 334, a p-well bias is set in a disabled state. A p-wellbias controller can be configured to provide a p-well bias voltage to aswitch receiving a signal from a power amplifier. The power amplifiercan provide a signal to an associated switch. During start-up of thepower amplifier, the power amplifier can produce a transient signalwhich can be received by a switch. The transient signal can result inthe forward biasing of parasitic diode structures associated with theswitch. By disabling the p-well bias in block 334, protection againstforward biasing of parasitic diode structures in the switch is provided.Disabling of the p-well bias control block can be performed using adisable circuit, as described above.

The method 330 continues at a block 336, in which one or more poweramplifiers are enabled. Enabling power amplifiers in block 336 cangenerate transient signals which can be received by switches. However,as described above in block 334, the p-well bias can be in a disabledstate associated with a relatively low voltage. Thus, even if the poweramplifiers produce transient electrical signals or quiescent currentsonce enabled in block 336, forward biasing of parasitic diode structuresin the switches can be avoided.

In an ensuing block 338, the p-well bias can be set in an enabled state.This can result in a p-well bias control block biasing the p-well of oneor more switches in the proper state. This can include biasing one ormore p-wells associated with one or more switches to a voltageassociated with an ON switch, such as a relatively high voltage, such asa battery supply voltage. Additionally, this can include biasing one ormore p-wells associated with one or more switches to a voltageassociated with an OFF switch, such as a relatively low voltage, such asa voltage several volts below a battery supply voltage. The method endsat 340.

Applications

Some of the embodiments described above have provided examples inconnection with mobile phones. However, the principles and advantages ofthe embodiments can be used for any other systems or apparatus that haveneeds for power amplifier systems.

Such power amplifier systems can be implemented in various electronicdevices. Examples of the electronic devices can include, but are notlimited to, consumer electronic products, parts of the consumerelectronic products, electronic test equipment, etc. Examples of theelectronic devices can also include, but are not limited to, memorychips, memory modules, circuits of optical networks or othercommunication networks, and disk driver circuits. The consumerelectronic products can include, but are not limited to, a mobile phone,a telephone, a television, a computer monitor, a computer, a hand-heldcomputer, a personal digital assistant (PDA), a microwave, arefrigerator, an automobile, a stereo system, a cassette recorder orplayer, a DVD player, a CD player, a VCR, an MP3 player, a radio, acamcorder, a camera, a digital camera, a portable memory chip, a washer,a dryer, a washer/dryer, a copier, a facsimile machine, a scanner, amulti functional peripheral device, a wrist watch, a clock, etc.Further, the electronic devices can include unfinished products.

CONCLUSION

Unless the context clearly requires otherwise, throughout thedescription and the claims, the words “comprise,” “comprising,” and thelike are to be construed in an inclusive sense, as opposed to anexclusive or exhaustive sense; that is to say, in the sense of“including, but not limited to.” The word “coupled”, as generally usedherein, refers to two or more elements that may be either directlyconnected, or connected by way of one or more intermediate elements.Additionally, the words “herein,” “above,” “below,” and words of similarimport, when used in this application, shall refer to this applicationas a whole and not to any particular portions of this application. Wherethe context permits, words in the above Detailed Description using thesingular or plural number may also include the plural or singular numberrespectively. The word “or” in reference to a list of two or more items,that word covers all of the following interpretations of the word: anyof the items in the list, all of the items in the list, and anycombination of the items in the list.

Moreover, conditional language used herein, such as, among others,“can,” “could,” “might,” “can,” “e.g.,” “for example,” “such as” and thelike, unless specifically stated otherwise, or otherwise understoodwithin the context as used, is generally intended to convey that certainembodiments include, while other embodiments do not include, certainfeatures, elements and/or states. Thus, such conditional language is notgenerally intended to imply that features, elements and/or states are inany way required for one or more embodiments or that one or moreembodiments necessarily include logic for deciding, with or withoutauthor input or prompting, whether these features, elements and/orstates are included or are to be performed in any particular embodiment.

The above detailed description of embodiments of the invention is notintended to be exhaustive or to limit the invention to the precise formdisclosed above. While specific embodiments of, and examples for, theinvention are described above for illustrative purposes, variousequivalent modifications are possible within the scope of the invention,as those skilled in the relevant art will recognize. For example, whileprocesses or blocks are presented in a given order, alternativeembodiments may perform routines having steps, or employ systems havingblocks, in a different order, and some processes or blocks may bedeleted, moved, added, subdivided, combined, and/or modified. Each ofthese processes or blocks may be implemented in a variety of differentways. Also, while processes or blocks are at times shown as beingperformed in series, these processes or blocks may instead be performedin parallel, or may be performed at different times.

The teachings of the invention provided herein can be applied to othersystems, not necessarily the system described above. The elements andacts of the various embodiments described above can be combined toprovide further embodiments.

While certain embodiments of the inventions have been described, theseembodiments have been presented by way of example only, and are notintended to limit the scope of the disclosure. Indeed, the novel methodsand systems described herein may be embodied in a variety of otherforms; furthermore, various omissions, substitutions and changes in theform of the methods and systems described herein may be made withoutdeparting from the spirit of the disclosure. The accompanying claims andtheir equivalents are intended to cover such forms or modifications aswould fall within the scope and spirit of the disclosure.

1. An apparatus for controlling one or more power amplifiers, theapparatus comprising: a first complimentary metal oxide semiconductor(CMOS) switch having a gate, a drain, a source, and a well, the sourceand drain formed in the well, the gate formed adjacent the well betweenthe source and drain, and the source configured to receive a radiofrequency signal from a first power amplifier; a switch enable detectblock configured to compare a signal indicative of the gate voltage ofthe first switch to a first reference signal and to generate an outputcomparison signal based at least partly on the result; and a poweramplifier bias control block configured to enable the first poweramplifier based at least partly on the output comparison signal from theswitch enable detect block.
 2. The apparatus of claim 1, wherein thewell has a p-type doping and the first switch includes an n-well forelectrically isolating the well from a substrate.
 3. The apparatus ofclaim 1, further comprising a gate bias control block for biasing thegate voltage of the first switch, the gate bias control block configuredto bias the gate voltage of the first switch to at least two voltagelevels.
 4. The apparatus of claim 3, wherein the switch enable detectblock is configured to compare an enable signal of the gate bias controlblock to the reference signal.
 5. The apparatus of claim 3, wherein thegate bias control block comprises at least one charge pump.
 6. Theapparatus of claim 1, wherein the switch enable detect block isconfigured to compare the gate voltage of the first switch to thereference signal.
 7. The apparatus of claim 1, wherein the referencesignal is a voltage of the well of the first CMOS switch.
 8. Theapparatus of claim 1, further comprising a second CMOS switch having agate, a drain, a source, and a well, the source and drain formed in thewell, and the gate formed adjacent the well between the source anddrain, and the source configured to receive a radio frequency signalfrom a second power amplifier.
 9. The apparatus of claim 8, wherein theswitch enable detect block is further configured to compare a signalindicative of the gate voltage of the second switch to a secondreference signal and to generate the output comparison signal based atleast partly on the comparison, and the power amplifier bias controlblock is configured to enable the second power amplifier based at leastpartly on the output comparison signal from the switch enable detectblock.
 10. The apparatus of claim 8, further comprising a well biascontrol block for biasing the well voltage of the first and secondswitches to a well bias voltage, the well bias control block configuredto bias the well bias voltage to at least two voltage levels.
 11. Theapparatus of claim 8, wherein the first and second reference signals areequal to about the well bias voltage.
 12. The apparatus of claim 11,wherein the switch enable detect block is a NOR gate configured toreceive the gate voltage of the first switch as a first input and thegate voltage of the second switch as a second input, the negative supplyof the NOR gate equal to about the well bias voltage.
 13. The apparatusof claim 12, further comprising a level shifter configured to receivethe output comparison signal from the switch enable detect block andprovide a level shifted output comparison signal to the power amplifierbias control block.
 14. The apparatus of claim 1, wherein the firstswitch and the first power amplifier are disposed on separate dies. 15.A method of controlling one or more power amplifiers, the methodcomprising: setting a first power amplifier in a disabled state;measuring a signal indicative of a gate voltage of a CMOS switch havinga source configured to receive a radio frequency signal from the firstpower amplifier; comparing the measured signal to a reference signal;and setting the first power amplifier in an enabled state based at leastpartly on the comparison.
 16. The method of claim 15, wherein comparingthe measured signal to a reference signal comprises determining if thegate voltage of the switch is greater than a well voltage of the switchby at least about a threshold voltage of the first switch.
 17. Themethod of claim 16, wherein comparing the measured signal to a referencesignal comprises determining if the gate voltage of the switch isgreater than the well voltage of the switch by at least about n timesthe threshold voltage of the switch, n being an integer greater than orequal to one.
 18. The method of claim 15, further comprising biasing thegate voltage of the switch.
 19. The method of claim 18, wherein biasingthe gate voltage of the switch comprises biasing the gate voltage of theswitch using a charge pump.
 20. The method of claim 19, whereincomparing the measured signal to a reference signal comprises comparingan enable signal of the charge pump to the reference signal.
 21. Themethod of claim 15, further comprising providing a quiescent current ofthe power amplifier to the source of the switch after enabling the poweramplifier.
 22. The method of claim 15, further comprising providing aradio frequency signal from the first power amplifier to an antenna of awireless device through the switch.
 23. A computer-readable storagemedium comprising instructions that when executed by a processor performa method of controlling a power amplifier configured to provide a radiofrequency signal to a CMOS switch, the method comprising: setting thepower amplifier in a disabled state; receiving a comparison signal, thecomparison signal based at least partly upon a comparison of a referencesignal to a signal indicative of a gate voltage of the CMOS switch; andsetting the power amplifier in an enabled state based at least partly onthe comparison signal.
 24. An apparatus for controlling one or morepower amplifiers, the apparatus comprising: means for setting a firstpower amplifier in a disabled state; means for measuring a signalindicative of a gate voltage of a CMOS switch, the CMOS switchconfigured to receive a radio frequency signal from the power amplifier;means for comparing the measured signal to a reference signal and forgenerating a comparison signal based at least partly on the result; andmeans for setting the power amplifier in an enabled state based at leastpartly on the comparison signal.